G01Q 30/10
Thermal environment
G01Q30/10 (Thermal environment) appears on 63 US grants and 55 published applications in this corpus.
Search patents in G01Q- Granted patents
- 63
- Published applications
- 55
- Assignees
- 61
- Inventors
- 154
- Latest grant
- 30 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 2 | 0 |
| 1996 | 2 | 0 |
| 1997 | 2 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 4 | 1 |
| 2002 | 2 | 2 |
| 2003 | 2 | 2 |
| 2004 | 2 | 2 |
| 2005 | 0 | 0 |
| 2006 | 1 | 0 |
| 2007 | 2 | 2 |
| 2008 | 2 | 2 |
| 2009 | 1 | 1 |
| 2010 | 1 | 3 |
| 2011 | 0 | 2 |
| 2012 | 1 | 0 |
| 2013 | 1 | 4 |
| 2014 | 3 | 1 |
| 2015 | 5 | 4 |
| 2016 | 1 | 1 |
| 2017 | 1 | 3 |
| 2018 | 0 | 0 |
| 2019 | 3 | 5 |
| 2020 | 4 | 4 |
| 2021 | 5 | 4 |
| 2022 | 2 | 2 |
| 2023 | 4 | 3 |
| 2024 | 1 | 2 |
| 2025 | 3 | 3 |
| 2026 | 1 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Frozen solution sample preparation device applicable to ultra-high vacuum system30 Jun 2026US 12,669,418 B2Peking University
- Damping base for modular scanning probe microscope head15 Jul 2025US 12,360,136 B2Rutgers, The State University of New Jersey
- Scattering-type scanning near-field optical microscopy with Akiyama piezo-probes11 Mar 2025US 12,247,998 B2The Research Foundation for The State University of New York
- Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)4 Mar 2025US 12,241,911 B2Bruker Nano, Inc.
- Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)26 Mar 2024US 11,940,461 B2Bruker Nano, Inc.
- A probing device comprising a heat transfer arrangement, a method of manufacturing a probing device, and a method for probing a sample30 Jul 2026US 2026/0219296 A1Teknologian tutkimuskeskus VTT Oy
- Sample Holder and Measurement Method for Scanning Tunneling Microscopy23 Jul 2026US 2026/0211000 A1National Taiwan University
- Heat Dissipating AFM Probe18 Sep 2025US 2025/0290949 A1Bruker Nano, Inc.
- Frozen solution sample preparation device applicable to ultra-high vacuum system10 Jul 2025US 2025/0224316 A1Peking University
- Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)8 May 2025US 2025/0147066 A1Bruker Nano, Inc.
Most cited
By later US patents
- Variable temperature scanning probe microscope based on a peltier device95US 5,654,546 AMolecular Imaging Corporation · 1997
- System for analyzing surfaces of samples47US 5,619,035 ABiotechnology Research and Development Corporation · 1997
- System for analyzing surfaces of samples43US 5,504,366 ABiotechnology Research and Development Corporation · 1996
- Small cavity analytical instruments41US 5,559,328 ABiotechnology Research and Development Corporation · 1996
- Cryogenic atomic force microscope29US 5,410,910 AUniversity of Virginia Patent Foundation · 1995