Damping base for modular scanning probe microscope head
AssigneeRutgers, The State University of New Jersey
InventorsAngela M. Coe, Guohong Li, Eva Y. Andrei
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Abstract
An apparatus, including a scanning probe microscope base that includes a configured to be secured to an end of an insert in a cryostat; a top configured to be connected to a base of a scanning probe microscope head that is configured to be disposed inside the insert; and a damping system disposed between the frame and the top and comprising a bellows that seals the end of the insert. This sealing separates an ultra-high vacuum (UHV) environment in the insert from a high vacuum (HV) environment surrounding the end of the insert and also positions an upper surface of the top in the UHV environment.
Claims27
An apparatus, comprising a scanning probe microscope base comprising:
- a frame configured to be secured to an end of an insert in a cryostat;
- a top configured to be connected to a base of a scanning probe microscope head that is configured to be disposed inside the insert;
- and
- a vibration control system disposed between the frame and the top;
- wherein the vibration control system comprises a bellows, wherein an upper end of the bellows is secured to the top and a lower end of the bellows is secured to the frame.
An apparatus, comprising a scanning probe microscope base comprising:
- a frame configured to be secured to an end of an insert in a cryostat;
- a top configured to be connected to a base of a scanning probe microscope head that is configured to be disposed inside the insert;
- and
- a damping system disposed between the frame and the top and comprising a bellows that seals the end of the insert thereby separating an ultra-high vacuum (UHV) environment in the insert from a high vacuum (HV) environment surrounding the end of the insert and also thereby positioning an upper surface of the top in the UHV environment.
Dependencies are inferred from the claim text.