Sample Holder and Measurement Method for Scanning Tunneling Microscopy

A method for performing in-situ cross-sectional scanning tunneling microscopy measurements on a sample under ultra-high vacuum conditions, the method comprising:

• providing a multifunctional sample holder configured to operate under ultra-high vacuum, the sample holder including:
• a base module having at least one insulating plate made of a vacuum-compatible polymer and at least one conductive plate made of a highly conductive metal, the insulating plate and the conductive plate being fastened together to form a single support structure;
• a sample-fixing assembly mounted on the base module, the sample-fixing assembly comprising at least one clamping component and at least one fastener, wherein the sample-fixing assembly is adapted to position and hold a sample in an upright orientation so that, upon in-situ cleaving, the sample's cross section is exposed;
• a plurality of electrical contact elements extending from the outer surface to an interior portion of the base module, the electrical contact elements being arranged to connect with at least one electrode on the sample so as to apply a bias voltage or inject current into the sample;
• and
• at least one functional element disposed on or within the base module, selected from the group consisting of a heating element, a temperature sensor, and a magnetic field generating element;
• mounting a sample in an upright orientation onto the sample-fixing assembly of the sample holder, the sample having a pre-scored notch in the region to be cleaved;
• placing the sample holder into a vacuum chamber and evacuating the chamber to ultra-high vacuum conditions;
• cleaving the sample along the pre-scored notch to expose a new cross section of the sample while keeping the sample mounted in the sample holder;
• applying at least one of a bias voltage, a variable temperature, or a magnetic field to the sample;
• and
• positioning the tip of a scanning tunneling microscope above the newly cleaved cross section of the sample to perform atomic-scale measurements.