G01Q 10/06
Circuits or algorithms therefor
G01Q10/06 (Circuits or algorithms therefor) appears on 495 US grants and 423 published applications in this corpus.
Search patents in G01Q- Granted patents
- 495
- Published applications
- 423
- Assignees
- 219
- Inventors
- 865
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1989 | 4 | 0 |
| 1990 | 4 | 0 |
| 1991 | 5 | 0 |
| 1992 | 9 | 0 |
| 1993 | 11 | 0 |
| 1994 | 11 | 0 |
| 1995 | 10 | 0 |
| 1996 | 12 | 0 |
| 1997 | 5 | 0 |
| 1998 | 14 | 0 |
| 1999 | 14 | 0 |
| 2000 | 5 | 0 |
| 2001 | 6 | 6 |
| 2002 | 8 | 19 |
| 2003 | 14 | 10 |
| 2004 | 18 | 18 |
| 2005 | 16 | 20 |
| 2006 | 20 | 30 |
| 2007 | 20 | 23 |
| 2008 | 19 | 22 |
| 2009 | 21 | 21 |
| 2010 | 10 | 19 |
| 2011 | 25 | 24 |
| 2012 | 14 | 16 |
| 2013 | 18 | 10 |
| 2014 | 20 | 13 |
| 2015 | 10 | 18 |
| 2016 | 18 | 16 |
| 2017 | 17 | 18 |
| 2018 | 21 | 19 |
| 2019 | 13 | 21 |
| 2020 | 21 | 13 |
| 2021 | 18 | 11 |
| 2022 | 8 | 12 |
| 2023 | 13 | 13 |
| 2024 | 8 | 13 |
| 2025 | 12 | 13 |
| 2026 | 3 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Atomic force microscope (AFM) device and method of operating the same8 Sep 2026US 12,730,127 B2Nearfield Instruments B.V.
- Indentation head for an indentation instrument16 Jun 2026US 12,656,233 B2Anton Paar Tritec SA
- Automated landing method of a scanning probe microscopy system and scanning probe microscopy system using the same10 Feb 2026US 12,546,800 B2Nearfield Instruments B.V.
- Hybrid near-field scanning microwave microscope18 Nov 2025US 12,474,369 B2Universidade De Aveiro
- Measurement system and probe tip landing method18 Nov 2025US 12,474,371 B2Windbond Electronics Corp.
- Afm device and method1 Oct 2026US 2026/0298972 A1Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Multi-head afm for defect inspection and review24 Sep 2026US 2026/0287612 A1Nearfield Instruments B.V.
- Computer-implemented method and apparatus for processing a sample using a nanomanipulator10 Sep 2026US 2026/0266867 A1
- Method of analyzing a probe tip deflection signal of a scanning probe microscopy system27 Aug 2026US 2026/0251676 A1Nearfield Instruments B.V.
- Atomic force microscope using a single light source to drive cantilever vibrations and sense cantilever motions13 Aug 2026US 2026/0235642 A1Molecular Vista, Inc.
Most cited
By later US patents
- Scanning probe microscope143US 5,376,790 APark Scientific Instruments · 1994
- Edge detector101US 5,304,924 ACanon Kabushiki Kaisha · 1994
- Atomic force microscope for high speed imaging including integral actuator and sensor99US 5,883,705 AThe Board of Trustees of the Leland Stanford Jr. University · 1999
- Scanning microscope comprising force-sensing means and position-sensitive photodetector95US 5,254,854 AAT&T Bell Laboratories · 1993
- Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light93US 5,289,004 AOlympus Optical Co., Ltd. · 1994