G01N 2223/418
Electron microscope
Official title: electron microscope
G01N2223/418 (Electron microscope) appears on 250 US grants and 321 published applications in this corpus.
Search patents in G01N- Granted patents
- 250
- Published applications
- 321
- Assignees
- 146
- Inventors
- 822
- Latest grant
- 4 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 2 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 1 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 1 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 1 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 4 |
| 2013 | 3 | 6 |
| 2014 | 6 | 11 |
| 2015 | 7 | 11 |
| 2016 | 8 | 13 |
| 2017 | 18 | 20 |
| 2018 | 17 | 15 |
| 2019 | 13 | 14 |
| 2020 | 20 | 30 |
| 2021 | 19 | 37 |
| 2022 | 29 | 46 |
| 2023 | 33 | 43 |
| 2024 | 35 | 29 |
| 2025 | 20 | 28 |
| 2026 | 17 | 12 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- System and method for modeling a rock sample4 Aug 2026US 12,699,817 B2Saudi Arabian Oil Company
- Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions4 Aug 2026US 12,700,247 B2Protochips, Inc.
- Method of evaluating primary optical system of electron beam observation device, evaluation device used therefor, and method of manufacturing same16 Jun 2026US 12,656,280 B2Ebara Corporation
- Determining a position of an object in a beam apparatus16 Jun 2026US 12,658,406 B2Carl Zeiss Microscopy GmbH
- Blanker-enhanced moire imaging26 May 2026US 12,640,332 B2FEI Company
- Method and apparatus for dictionary learning and for reconstructing images using a dictionary17 Sep 2026US 2026/0276569 A1The University of Liverpool
- Alloy composition calculation apparatus, method, program, and system27 Aug 2026US 2026/0251586 A1Resonac Corporation
- System for the continuous-wave laser processing and sem characterisation of a sample20 Aug 2026US 2026/0245827 A1
- Diversifying sem measurement scheme for improved accuracy6 Aug 2026US 2026/0227350 A1ASML Netherlands B. V.
- Systems and methods for analyzing a sample using charged particle beams and active pixel control sensors9 Jul 2026US 2026/0196438 A1FEI Company
Most cited
By later US patents
- Electron-optical system for high-speed and high-sensitivity inspections113US 8,664,594 B1KLA-Tencor Corporation · 2014
- Method and apparatus for material analysis43US 4,476,386 ACommonwealth Scientific and Industrial Research Organization · 1984
- Apparatus of plural charged-particle beams36US 10,062,541 B2Hermes Microvision, Inc. · 2018
- Device for detecting secondary electrons in a scanning electron microscope29US 4,442,355 AJEOL Ltd. · 1984
- Thermal wave microscopy using areal infrared detection22US 4,578,584 AInternational Business Machines Corporation · 1986