G01N 2223/335
Electronic scanning
Official title: electronic scanning
G01N2223/335 (Electronic scanning) appears on 8 US grants and 16 published applications in this corpus.
Search patents in G01N- Granted patents
- 8
- Published applications
- 16
- Assignees
- 12
- Inventors
- 61
- Latest grant
- 26 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2015 | 0 | 1 |
| 2016 | 0 | 0 |
| 2017 | 2 | 1 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 0 |
| 2021 | 0 | 2 |
| 2022 | 0 | 4 |
| 2023 | 3 | 0 |
| 2024 | 2 | 2 |
| 2025 | 0 | 3 |
| 2026 | 1 | 3 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Blanker-enhanced moire imaging26 May 2026US 12,640,332 B2FEI Company
- Method and system to determine crystal structure21 May 2024US 11,988,618 B2FEI Company
- Multi-channel static CT device20 Feb 2024US 11,906,447 B2Nuctech Company Limited
- Methods and systems for acquiring three-dimensional electron diffraction data14 Nov 2023US 11,815,476 B2FEI Company
- Analysis method and analysis apparatus11 Jul 2023US 11,698,336 B2JEOL Ltd.
- Diversifying sem measurement scheme for improved accuracy6 Aug 2026US 2026/0227350 A1ASML Netherlands B. V.
- Methods and Systems for Accurate Temporal Correlation of Non-Stationary X-Ray Beams with Detector Arrays for Enhanced Detection Capabilities7 May 2026US 2026/0126402 A1Rapiscan Holdings, Inc.
- Electron count and energy enhanced diffraction analysis26 Feb 2026US 2026/0056147 A1FEI Company
- Image Acquisition Method and Scanning Transmission Electron Microscope20 Nov 2025US 2025/0354945 A1JEOL Ltd.
- Radiation tolerant detector architecture for charged particle detection9 Oct 2025US 2025/0316444 A1ASML Netherlands B. V.
Most cited
By later US patents