G01N 2223/041
X-ray absorption fine structure [exafs]
Official title: X-ray absorption fine structure [EXAFS]
G01N2223/041 (X-ray absorption fine structure [exafs]) appears on 15 US grants and 16 published applications in this corpus.
Search patents in G01N- Granted patents
- 15
- Published applications
- 16
- Assignees
- 12
- Inventors
- 20
- Latest grant
- 4 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 1 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 1 | 1 |
| 2018 | 1 | 1 |
| 2019 | 0 | 0 |
| 2020 | 0 | 0 |
| 2021 | 0 | 2 |
| 2022 | 4 | 5 |
| 2023 | 2 | 2 |
| 2024 | 2 | 2 |
| 2025 | 3 | 2 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Analysis apparatus, analysis method, and analysis program4 Aug 2026US 12,699,062 B2Rigaku Corporation
- System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes30 Sep 2025US 12,429,437 B2Sigray, Inc.
- Spectrometer25 Feb 2025US 12,235,228 B2EasyXAFS, LLC
- X-ray detector system with at least two stacked flat Bragg diffractors28 Jan 2025US 12,209,977 B2Sigray, Inc.
- Systems and methods for generating an inspection image of an object from radiographic imaging16 Jul 2024US 12,039,713 B2Pratt & Whitney Canada Corp.
- Spectrometer22 May 2025US 2025/0164421 A1EasyXAFS, LLC
- System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes8 May 2025US 2025/0146960 A1Sigray, Inc.
- Analysis apparatus, analysis method, and analysis program26 Sep 2024US 2024/0319121 A1Rigaku Corporation
- X-ray detector system with at least two stacked flat bragg diffractors22 Aug 2024US 2024/0280515 A1Sigray, Inc.
- X-ray sequential array wavelength dispersive spectrometer2 Nov 2023US 2023/0349842 A1Sigray, Inc.
Most cited
By later US patents
- System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements15US 11,215,572 B2Sigray, Inc. · 2022
- Kinematic X-ray analyses apparatus14US 4,637,041 ATechnische Hogeschool Eindhoven · 1987
- X-ray sequential array wavelength dispersive spectrometer8US 11,885,755 B2Sigray, Inc. · 2024
- X-ray detector system with at least two stacked flat Bragg diffractors5US 12,209,977 B2Sigray, Inc. · 2025
- Systems and methods for generating an inspection image of an object from radiographic imaging3US 11,341,629 B2Pratt & Whitney Canada Corp. · 2022