X-ray sequential array wavelength dispersive spectrometer
AssigneeSigray, Inc.
InventorsWenbing Yun, Ruimin Qiao, Sylvia Jia Yun Lewis, Srivatsan Seshadri, Janos Kirz, Benjamin Donald Stripe
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AssigneeSigray, Inc.
InventorsWenbing Yun, Ruimin Qiao, Sylvia Jia Yun Lewis, Srivatsan Seshadri, Janos Kirz, Benjamin Donald Stripe
Estimating the term…
An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.
An apparatus configured to receive x-rays propagating from an x-ray source along an x-ray propagation direction, the apparatus comprising:
Dependencies are inferred from the claim text.