Kinematic X-ray analyses apparatus
AssigneeTechnische Hogeschool Eindhoven
InventorsPeter Brinkgreve, Diederik C. Koningsberger
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AssigneeTechnische Hogeschool Eindhoven
InventorsPeter Brinkgreve, Diederik C. Koningsberger
Estimating the term…
In an X-ray analysis apparatus, a moving mechanism is provided by a main guide member along which a main slide device can be displaced. Rotatably connected with the main slide device is a detector guide member along which a detection slide device is displaced. The main slide device, as well as the detection slide device, and an axis of rotation relative to an end of the main guide member are connected to a common central axis by respective arms which can be mutually rotated with them. The main slide device and the detection slide device can each be equipped with a drive motor where the motor for the main slide device is preferably driven first, and the motor for the detector slide device is driven by signals derived from displacing the main slide device. The rotatable arms ensure an optimum orientation of a crystal holder incorporated onto the main slide device, and a detection holder incorporated onto the detector slide device with respect to each other and with respect to a point of focus of an X-ray source.
An X-ray analysis apparatus, comprising an X-ray source, a sample holder, a crystal holder, an X-ray detection device, and moving means for displacing an orienting said crystal holder and said detection device with respect to one another relative to said X-ray source
An X-ray analysis apparatus comprising an X-ray source, a sample holder, a crystal holder, an X-ray detection device, and moving means for displacing and orienting said crystal holder and said detection device with respect to one another relative to said X-ray source
An X-ray analysis apparatus comprising an X-ray source, a sample holder, a crystal holder, an X-ray detection device, and moving means for displacing and orienting said crystal holder and said detection device with respect to one another relative to said X-ray source
Dependencies are inferred from the claim text.