G01N 2201/1035
3d motion
Official title: 3D motion
G01N2201/1035 (3d motion) appears on 10 US grants and 10 published applications in this corpus.
Search patents in G01N- Granted patents
- 10
- Published applications
- 10
- Assignees
- 7
- Inventors
- 25
- Latest grant
- 16 May 2023
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 2 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 1 |
| 2004 | 1 | 0 |
| 2005 | 0 | 1 |
| 2006 | 1 | 1 |
| 2007 | 0 | 0 |
| 2008 | 1 | 0 |
| 2009 | 0 | 1 |
| 2010 | 0 | 0 |
| 2011 | 1 | 1 |
| 2012 | 1 | 1 |
| 2013 | 1 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 0 | 0 |
| 2017 | 1 | 1 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 0 |
| 2021 | 0 | 0 |
| 2022 | 0 | 1 |
| 2023 | 1 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Three-dimensional raman image mapping measuring device for flowable sample16 May 2023US 11,650,160 B2P&K Skin Research Center
- Programmable digital machine vision inspection system18 Apr 2017US 9,626,753 B2Shenzhen AMI Technology Co., Ltd.
- Apparatus and method for inspecting pattern28 May 2013US 8,451,439 B2Hitachi, Ltd.
- Apparatus and method for inspecting pattern3 Apr 2012US 8,149,395 B2Hitachi, Ltd.
- Apparatus and method for inspecting pattern22 Mar 2011US 7,911,601 B2Hitachi, Ltd.
- Multi-azimuth illumination and imaging inspection system and method20 Nov 2025US 2025/0354939 A1KLA Corporation
- Three-dimensional raman image mapping measuring device for flowable sample19 May 2022US 2022/0155235 A1P&K Skin Research Center
- Tomography System and Method for Large-volume Recordings4 May 2017US 2017/0123083 A1
- Programmable Digital Machine Vision Inspection System10 Sep 2015US 2015/0254833 A1Shenzhen AMI Technology Co., Ltd.
- Apparatus and method for inspecting pattern12 Jul 2012US 2012/0176602 A1Hitachi, Ltd.
Most cited
By later US patents
- Method and apparatus for the automated analysis of three-dimensional objects72US 5,030,008 AKLA Instruments Corporation · 1991
- Surface analysis method and apparatus24US 5,055,679 AHitachi, Ltd. · 1991
- Apparatus and method for inspecting pattern6US 6,831,737 B2Hitachi, Ltd. · 2004
- Apparatus and method for inspecting pattern6US 7,081,953 B2Hitachi, Ltd. · 2006
- Apparatus and method for inspecting pattern1US 7,911,601 B2Hitachi, Ltd. · 2011