G01N 2201/0636
Reflectors
G01N2201/0636 (Reflectors) appears on 543 US grants and 761 published applications in this corpus.
Search patents in G01N- Granted patents
- 543
- Published applications
- 761
- Assignees
- 513
- Inventors
- 1,806
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1988 | 1 | 0 |
| 1989 | 4 | 0 |
| 1990 | 2 | 0 |
| 1991 | 2 | 0 |
| 1992 | 2 | 0 |
| 1993 | 3 | 0 |
| 1994 | 5 | 0 |
| 1995 | 3 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 1 | 1 |
| 2003 | 0 | 1 |
| 2004 | 1 | 1 |
| 2005 | 1 | 2 |
| 2006 | 2 | 8 |
| 2007 | 4 | 11 |
| 2008 | 4 | 5 |
| 2009 | 3 | 10 |
| 2010 | 6 | 17 |
| 2011 | 6 | 5 |
| 2012 | 9 | 4 |
| 2013 | 3 | 10 |
| 2014 | 10 | 9 |
| 2015 | 13 | 30 |
| 2016 | 20 | 37 |
| 2017 | 21 | 33 |
| 2018 | 35 | 37 |
| 2019 | 25 | 38 |
| 2020 | 39 | 41 |
| 2021 | 43 | 63 |
| 2022 | 41 | 55 |
| 2023 | 44 | 80 |
| 2024 | 60 | 100 |
| 2025 | 66 | 90 |
| 2026 | 61 | 73 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Optical systems and optical measuring apparatus29 Sep 2026US 12,748,038 B2Yokogawa Electric Corporation
- Spectroscopic apparatus and gas detection apparatus15 Sep 2026US 12,736,467 B2Tamron Co., Ltd.
- Microspot reflectometer1 Sep 2026US 12,723,980 B2The Boeing Company
- Optimized mirror-based light focusing for optical sensor assembly25 Aug 2026US 12,716,834 B2APPLIED Materials.Inc.
- Recycling optical cavity, optical system, and optical construction18 Aug 2026US 12,710,368 B23M Innovative Properties Company
- All-Reflective Optical Imaging Spectrometer with Flat Dispersive Element8 Oct 2026US 2026/0309620 A1
- Interference observation device and interference observation method8 Oct 2026US 2026/0309643 A1Hamamatsu Photonics K.K.
- Method and apparatus for inspecting a wafer8 Oct 2026US 2026/0311320 A1Taiwan Semiconductor Manufacturing Company.Ltd
- System for detecting fluid in container for receiving semiconductor device8 Oct 2026US 2026/0314312 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Multiple Azimuth, Multiple Pass Optical Measurements Of Semiconductor Structures1 Oct 2026US 2026/0298807 A1
Most cited
By later US patents
- Fluorometers466US 8,305,580 B2Precisense A/S · 2012
- Instrument for monitoring polymerase chain reaction of DNA108US 7,008,789 B2Applera Corporation · 2006
- Instrument for monitoring polymerase chain reaction of DNA73US 6,818,437 B1Applera Corporation · 2004
- System for identifying defects in a composite structure66US 6,871,684 B2The Boeing Company · 2005
- Rapid-scanning infrared sensor63US 4,879,471 AMeasurex Corporation · 1989