G01N 21/8422
Investigating thin films
Official title: {Investigating thin films, e.g. matrix isolation method}
G01N21/8422 (Investigating thin films) appears on 1,190 US grants and 1,292 published applications in this corpus.
Search patents in G01N- Granted patents
- 1,190
- Published applications
- 1,292
- Assignees
- 777
- Inventors
- 3,341
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 2 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 4 | 0 |
| 1985 | 3 | 0 |
| 1986 | 6 | 0 |
| 1987 | 11 | 0 |
| 1988 | 9 | 0 |
| 1989 | 13 | 0 |
| 1990 | 13 | 0 |
| 1991 | 8 | 0 |
| 1992 | 16 | 0 |
| 1993 | 6 | 0 |
| 1994 | 14 | 0 |
| 1995 | 7 | 0 |
| 1996 | 9 | 0 |
| 1997 | 6 | 0 |
| 1998 | 5 | 0 |
| 1999 | 5 | 0 |
| 2000 | 7 | 0 |
| 2001 | 4 | 2 |
| 2002 | 12 | 14 |
| 2003 | 20 | 30 |
| 2004 | 20 | 40 |
| 2005 | 25 | 41 |
| 2006 | 38 | 32 |
| 2007 | 21 | 46 |
| 2008 | 44 | 40 |
| 2009 | 31 | 32 |
| 2010 | 32 | 37 |
| 2011 | 28 | 29 |
| 2012 | 29 | 34 |
| 2013 | 30 | 39 |
| 2014 | 32 | 37 |
| 2015 | 30 | 54 |
| 2016 | 46 | 66 |
| 2017 | 46 | 61 |
| 2018 | 53 | 80 |
| 2019 | 71 | 70 |
| 2020 | 69 | 68 |
| 2021 | 53 | 79 |
| 2022 | 57 | 98 |
| 2023 | 68 | 89 |
| 2024 | 66 | 74 |
| 2025 | 83 | 63 |
| 2026 | 35 | 37 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Optical inspection of waterjet drilled holes6 Oct 2026US 12,754,139 B1Rtx Corporation
- Optical measurement device for inspection of discontinuities in aerostructures29 Sep 2026US 12,748,052 B2Spirit AeroSystems, Inc.
- Method for analyzing thin film and device for analyzing thin film25 Aug 2026US 12,716,709 B2Samsung Display Co., Ltd.
- Measurement method and substrate processing apparatus25 Aug 2026US 12,716,840 B2Tokyo Electron Limited
- Method for checking and verifying the correct stripping process of the insulating layer in predefined sections of a conducting wire covered by a layer of dielectric material, and related assembly for checking and verifying25 Aug 2026US 12,718,355 B2ATOP S.p.A.
- Nozzle manifold assembly8 Oct 2026US 2026/0307085 A1The Aerospace Corporation
- Coating system and calibration method thereof8 Oct 2026US 2026/0309488 A1Contemporary Amperex Technology Co., Limited
- Optical inspection of waterjet drilled holes8 Oct 2026US 2026/0309636 A1Rtx Corporation
- Polymer monitoring device and method using terahertz waves17 Sep 2026US 2026/0276537 A1Iucf-Hyu (Industry-University Cooperation Foundation Hanyang
- Inspection system and method for determining the microstructure for a coating17 Sep 2026US 2026/0276553 A1General Electric Company
Most cited
By later US patents
- Optical generator and detector of stress pulses173US 4,710,030 ABw Brown University Research Foundation · 1987
- Method and apparatus for measuring properties of thin materials using polarized light117US 4,672,196 A1987
- Optical measurement device with enhanced sensitivity116US 5,159,412 ATherma-Wave, Inc. · 1992
- Method and apparatus for monitoring surface layer growth105US 4,945,254 AThe Secretary of State for Defence in Her Britannic Majesty's Government for the United Kingdom of Great Britain and Northern Ireland · 1990
- Method and apparatus of determining optical constants of amorphous semiconductors and dielectrics102US 4,905,170 A1990