G01N 2021/556
Measuring separately scattering and specular
Official title: {Measuring separately scattering and specular}
G01N2021/556 (Measuring separately scattering and specular) appears on 124 US grants and 123 published applications in this corpus.
Search patents in G01N- Granted patents
- 124
- Published applications
- 123
- Assignees
- 77
- Inventors
- 305
- Latest grant
- 18 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1987 | 1 | 0 |
| 1988 | 2 | 0 |
| 1989 | 0 | 0 |
| 1990 | 2 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 2 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 3 | 2 |
| 2003 | 1 | 2 |
| 2004 | 2 | 6 |
| 2005 | 2 | 3 |
| 2006 | 4 | 14 |
| 2007 | 8 | 4 |
| 2008 | 2 | 1 |
| 2009 | 7 | 3 |
| 2010 | 3 | 9 |
| 2011 | 3 | 3 |
| 2012 | 4 | 4 |
| 2013 | 10 | 10 |
| 2014 | 2 | 4 |
| 2015 | 8 | 8 |
| 2016 | 11 | 5 |
| 2017 | 5 | 8 |
| 2018 | 5 | 9 |
| 2019 | 9 | 4 |
| 2020 | 5 | 7 |
| 2021 | 2 | 5 |
| 2022 | 4 | 1 |
| 2023 | 2 | 3 |
| 2024 | 3 | 4 |
| 2025 | 3 | 1 |
| 2026 | 3 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Optical inspection method, non-transitory storage medium, and optical inspection apparatus18 Aug 2026US 12,710,356 B2Kabushiki Kaisha Toshiba
- Robotic cleaner having surface type sensor26 May 2026US 12,635,839 B2SharkNinja Operating LLC
- System and method for liquid dispense and coverage control14 Apr 2026US 12,599,922 B2Tokyo Electron Limited
- Method and apparatus for bacterial analysis2 Sep 2025US 12,405,271 B2The University of Bristol
- Methods and related aspects for analyzing exosomes20 May 2025US 12,306,098 B2Arizona Board of Regents on behalf of Arizona State University
- Determining roughness and index of refraction of a material28 May 2026US 2026/0146946 A1Adobe Inc.
- Sheet characteristic detection device and image forming system14 May 2026US 2026/0133529 A1Konica Minolta, Inc.
- Printing apparatus, method of controlling the same, and storage medium26 Mar 2026US 2026/0086033 A1Canon Kabushiki Kaisha
- Apparatuses, methods and computer program products for imaging a structure at least partially obscured, in a visible wavelength range, by a liquid24 Jul 2025US 2025/0237598 A1Sony Group Corporation
- Optical inspection method, non-transitory storage medium, and optical inspection apparatus26 Sep 2024US 2024/0319078 A1Kabushiki Kaisha Toshiba
Most cited
By later US patents
- Spectroscopic scatterometer system173US 6,483,580 B1KLA-Tencor Technologies Corporation · 2002
- Optical scatterometer having improved sensitivity and bandwidth125US 4,710,642 A1987
- Spectroscopic scatterometer system106US 6,590,656 B2KLA-Tencor Corporation · 2003
- Portable spectrophotometer87US 5,369,481 AX-Rite, Incorporated · 1994
- Inspecting apparatus for determining presence and location of foreign particles on reticles or pellicles75US 4,966,457 ANikon Corporation · 1990