G01M 11/0242
By measuring geometrical properties or aberrations
Official title: {by measuring geometrical properties or aberrations}
G01M11/0242 (By measuring geometrical properties or aberrations) appears on 927 US grants and 971 published applications in this corpus.
Search patents in G01M- Granted patents
- 927
- Published applications
- 971
- Assignees
- 465
- Inventors
- 2,096
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 3 | 0 |
| 1977 | 0 | 0 |
| 1978 | 2 | 0 |
| 1979 | 1 | 0 |
| 1980 | 0 | 0 |
| 1981 | 3 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 2 | 0 |
| 1986 | 2 | 0 |
| 1987 | 4 | 0 |
| 1988 | 2 | 0 |
| 1989 | 3 | 0 |
| 1990 | 3 | 0 |
| 1991 | 9 | 0 |
| 1992 | 2 | 0 |
| 1993 | 3 | 0 |
| 1994 | 8 | 0 |
| 1995 | 10 | 0 |
| 1996 | 4 | 0 |
| 1997 | 8 | 0 |
| 1998 | 18 | 0 |
| 1999 | 17 | 0 |
| 2000 | 14 | 0 |
| 2001 | 11 | 6 |
| 2002 | 18 | 13 |
| 2003 | 16 | 28 |
| 2004 | 29 | 30 |
| 2005 | 19 | 13 |
| 2006 | 15 | 19 |
| 2007 | 18 | 24 |
| 2008 | 21 | 31 |
| 2009 | 26 | 34 |
| 2010 | 23 | 45 |
| 2011 | 23 | 27 |
| 2012 | 28 | 52 |
| 2013 | 37 | 29 |
| 2014 | 36 | 34 |
| 2015 | 31 | 36 |
| 2016 | 25 | 35 |
| 2017 | 35 | 32 |
| 2018 | 27 | 44 |
| 2019 | 55 | 47 |
| 2020 | 43 | 54 |
| 2021 | 40 | 55 |
| 2022 | 40 | 68 |
| 2023 | 48 | 49 |
| 2024 | 42 | 63 |
| 2025 | 51 | 67 |
| 2026 | 51 | 36 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Optical combiners for binocular disparity detection6 Oct 2026US 12,754,099 B2Meta Platforms Technologies, LLC
- Method for online obtaining an initially extrinsic parameter of fisheye-lens cameras applied to surround-view stitching6 Oct 2026US 12,754,416 B2VIA Technologies, Inc.
- Self-calibration29 Sep 2026US 12,748,016 B2Essilor International
- Measurement device for interferometric measurement of a surface shape15 Sep 2026US 12,736,331 B2Carl Zeiss SMT GmbH
- Optical-based validation of orientations of internal facets15 Sep 2026US 12,736,334 B2Lumus Ltd.
- Method and apparatus for reducing non-normal incidence distortion in glazing films24 Sep 2026US 2026/0285019 A1RO Technologies, LLC
- Apparatus and method for measuring angle of inner surface of optical component in high-speed optical transceiver module10 Sep 2026US 2026/0266590 A1Accelight Technologies (Wuhan) Inc.
- Method and apparatus for measuring face form angle of spectacles and computer program product6 Aug 2026US 2026/0227651 A1Rodenstock GmbH
- Method for determining the inversion state of a soft contact lens23 Jul 2026US 2026/0210801 A1Alcon Inc.
- Optical element inspection method, system, and application9 Jul 2026US 2026/0194417 A1Fuyao Glass Industry Group Co., Ltd.
Most cited
By later US patents
- System and method of measuring and mapping three dimensional structures110US 7,455,407 B2AMO Wavefront Sciences, LLC · 2008
- Optical components107US 9,423,360 B1Microsoft Technology Licensing, LLC · 2016
- Lithographic projection apparatus, a grating module, a sensor module, a method of measuring wave front aberrations104US 6,650,399 B2ASML Netherlands B. V. · 2003
- Distortion inspecting method for projection optical system92US 5,402,224 ANikon Corporation · 1995
- Iterative least-squares wavefront estimation for general pupil shapes92US 7,088,457 B1University of Central Florida Research Foundation, Inc. · 2006