G01M 11/0278
Detecting defects of the object to be tested
Official title: {Detecting defects of the object to be tested, e.g. scratches or dust (investigating the presence of flaws or contamination on materials by optical means G01N21/88)}
G01M11/0278 (Detecting defects of the object to be tested) appears on 147 US grants and 145 published applications in this corpus.
Search patents in G01M- Granted patents
- 147
- Published applications
- 145
- Assignees
- 109
- Inventors
- 402
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 3 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 2 | 0 |
| 1995 | 3 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 5 | 0 |
| 1999 | 1 | 0 |
| 2000 | 5 | 0 |
| 2001 | 4 | 1 |
| 2002 | 8 | 2 |
| 2003 | 3 | 1 |
| 2004 | 7 | 5 |
| 2005 | 1 | 0 |
| 2006 | 1 | 2 |
| 2007 | 2 | 1 |
| 2008 | 2 | 3 |
| 2009 | 0 | 2 |
| 2010 | 1 | 3 |
| 2011 | 1 | 3 |
| 2012 | 1 | 1 |
| 2013 | 1 | 6 |
| 2014 | 3 | 4 |
| 2015 | 6 | 9 |
| 2016 | 5 | 6 |
| 2017 | 3 | 8 |
| 2018 | 8 | 5 |
| 2019 | 6 | 7 |
| 2020 | 8 | 14 |
| 2021 | 8 | 9 |
| 2022 | 9 | 15 |
| 2023 | 13 | 12 |
| 2024 | 5 | 11 |
| 2025 | 8 | 10 |
| 2026 | 10 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Micro light-emitting diode detection system and detection method25 Aug 2026US 12,716,774 B2Ji Hua Laboratory
- System and method for inspecting mold defects in wet ophthalmic lenses25 Aug 2026US 12,716,807 B2Emage Vision Pte. Ltd.
- Inspection apparatus and method of inspecting display substrate using the same14 Jul 2026US 12,684,254 B2Samsung Display Co., Ltd.
- Inspection of optical components in optical systems16 Jun 2026US 12,656,217 B2Viavi Solutions Inc.
- Inspection device for sub-element of reticle pod2 Jun 2026US 12,644,791 B2Gudeng Equipment Co., Ltd.
- Method and device for generating a dark-field inspection image of an ophthalmic lens21 May 2026US 2026/0140013 A1
- Polarizing film inspection device and polarizing film inspection method using the inspection device2 Apr 2026US 2026/0092830 A1Samsung Display Co., Ltd.
- Apparatus and System for Visual Inspection of Fiber Ends and Image Analysis Tool for Detecting Contamination15 Jan 2026US 2026/0016368 A1Panduit Corp.
- Optical apparatus, optical inspection apparatus, optical inspection system, and optical inspection method15 Jan 2026US 2026/0016369 A1Kabushiki Kaisha Toshiba
- Optical window inspection apparatus and laser radar apparatus1 Jan 2026US 2026/0002835 A1Denso Wave Incorporated
Most cited
By later US patents
- Lens inspection system and method82US 5,500,732 AJohnson & Johnson Vision Products, Inc. · 1996
- Ophthalmic lens inspection method and apparatus63US 5,717,781 AJohnson & Johnson Vision Products, Inc. · 1998
- Apparatus for surface inspections58US 5,377,002 ATet Techno Trust Investment Settlement · 1994
- Method and apparatus for detecting cosmetic defects in opthalmic lenses49US 3,988,068 AItek Corporation · 1976
- Method and apparatus for detecting defects in lenses47US 5,627,638 AProlaser Ltd. · 1997