Inspection apparatus and method of inspecting display substrate using the same

An inspection apparatus comprising:

• a stage on which a display substrate including a plurality of cell regions and a boundary region adjacent to the plurality of cell regions is seated;
• and
• a plurality of photographing units configured to photograph the display substrate,
• wherein the plurality of photographing units includes a first photographing unit configured to photograph a first photographing region of the display substrate, and a second photographing unit configured to photograph a second photographing region adjacent to the first photographing region of the display substrate,
• the first photographing unit is capable of independently adjusting the first photographing region and the second photographing unit is capable of independently adjusting the second photographing region, and
• a boundary of the first photographing region and a boundary of the second photographing region overlap the boundary region in a plan view,
• wherein a size of the first photographing region is different from a size of the second photographing region.