G01B 15/025
By measuring absorption
Official title: {by measuring absorption}
G01B15/025 (By measuring absorption) appears on 145 US grants and 112 published applications in this corpus.
Search patents in G01B- Granted patents
- 145
- Published applications
- 112
- Assignees
- 133
- Inventors
- 370
- Latest grant
- 9 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 3 | 0 |
| 1977 | 2 | 0 |
| 1978 | 3 | 0 |
| 1979 | 2 | 0 |
| 1980 | 2 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 3 | 0 |
| 1986 | 3 | 0 |
| 1987 | 2 | 0 |
| 1988 | 3 | 0 |
| 1989 | 3 | 0 |
| 1990 | 2 | 0 |
| 1991 | 2 | 0 |
| 1992 | 5 | 0 |
| 1993 | 3 | 0 |
| 1994 | 4 | 0 |
| 1995 | 2 | 0 |
| 1996 | 3 | 0 |
| 1997 | 1 | 0 |
| 1998 | 4 | 0 |
| 1999 | 2 | 0 |
| 2000 | 1 | 0 |
| 2001 | 2 | 1 |
| 2002 | 4 | 4 |
| 2003 | 5 | 1 |
| 2004 | 1 | 1 |
| 2005 | 2 | 0 |
| 2006 | 1 | 2 |
| 2007 | 1 | 2 |
| 2008 | 0 | 4 |
| 2009 | 2 | 3 |
| 2010 | 1 | 4 |
| 2011 | 5 | 4 |
| 2012 | 3 | 1 |
| 2013 | 3 | 0 |
| 2014 | 1 | 5 |
| 2015 | 2 | 2 |
| 2016 | 3 | 2 |
| 2017 | 4 | 4 |
| 2018 | 1 | 2 |
| 2019 | 2 | 4 |
| 2020 | 5 | 12 |
| 2021 | 6 | 12 |
| 2022 | 12 | 8 |
| 2023 | 8 | 8 |
| 2024 | 6 | 7 |
| 2025 | 5 | 7 |
| 2026 | 3 | 12 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- System and method to automatically count components embedded or coupled with assembly and storage equipment9 Jun 2026US 12,650,300 B2Creative Electron, Inc.
- State detection5 May 2026US 12,618,964 B2Essence Smartcare Ltd.
- Method to control gap for sheet manufacturing measurement processes14 Apr 2026US 12,601,590 B2Honeywell International Inc.
- Detection method, surface density device, detection means, and storage medium4 Nov 2025US 12,460,926 B2Contemporary Amperex Technology (Hong Kong) Limited
- Conveyor system and measuring device for determining water content of a construction material19 Aug 2025US 12,392,738 B2Troxler Electronic Laboratories, Inc.
- X-ray transmission inspection apparatus and x-ray transmission inspection method8 Oct 2026US 2026/0309652 A1Hitachi High-Tech Science Corporation
- Measurement head and gauge for improved measurement stability24 Sep 2026US 2026/0287524 A1Thermo Fisher Scientific Messtechnik GmbH
- Radiation source unit and measurement apparatus20 Aug 2026US 2026/0243562 A1Yokogawa Electric Corporation
- Measurement apparatus and control method13 Aug 2026US 2026/0235400 A1Yokogawa Electric Corporation
- Measurement apparatus2 Jul 2026US 2026/0185827 A1Yokogawa Electric Corporation
Most cited
By later US patents
- Method and system for low-dose three-dimensional imaging of a scene185US 6,744,848 B2Brandeis University · 2004
- X-ray compton scattering density measurement at a point within an object75US 6,563,906 B2University of New Brunswick · 2003
- Interferometer device and method62US 7,924,973 B2CSEM Centre Suisse d'Electronique et de Microtechnique SA · 2011
- Converting a digital radiograph to an absolute thickness map51US 7,480,363 B2GE Betz, Inc. · 2009
- Method and apparatus for X-ray and extreme ultraviolet inspection of lithography masks and other objects40US 6,002,740 AWisconsin Alumni Research Foundation · 1999