Interferometer device and method
AssigneeCSEM Centre Suisse d'Electronique et de Microtechnique SA
InventorsChristian Kottler, Rolf Kaufmann
Life of this patent
Estimating the term…
Loading patent…
AssigneeCSEM Centre Suisse d'Electronique et de Microtechnique SA
InventorsChristian Kottler, Rolf Kaufmann
Estimating the term…
The present invention discloses an interferometer device and method. In embodiments, the device comprises an electromagnetic radiation source emitting radiation having a first mean wavelength λLE; a phase grating having a first aspect ratio; an absorption grating having a second aspect ratio; and a detector. The electromagnetic radiation source, the phase grating, the absorption grating and the detector are radiatively coupled with each other. The absorption grating is positioned between the detector and the phase grating; the electromagnetic radiation source is positioned in front of the source grating; and wherein the phase grating is designed such to cause a phase shift that is smaller than π on the emitted radiation. Additional and alternative embodiments are specified and claimed.
An interferometer device, said device comprising:
A method for performing interferometry, said method comprising:
Dependencies are inferred from the claim text.