G01B 15/02
Measuring arrangements characterised by the use of electromagnetic waves or particle radiation
Official title: for measuring thickness
G01B15/02 (Measuring arrangements characterised by the use of electromagnetic waves or particle radiation) appears on 541 US grants and 428 published applications in this corpus.
Search patents in G01B- Granted patents
- 541
- Published applications
- 428
- Assignees
- 372
- Inventors
- 1,279
- Latest grant
- 4 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 7 | 0 |
| 1977 | 6 | 0 |
| 1978 | 8 | 0 |
| 1979 | 9 | 0 |
| 1980 | 4 | 0 |
| 1981 | 0 | 0 |
| 1982 | 3 | 0 |
| 1983 | 6 | 0 |
| 1984 | 8 | 0 |
| 1985 | 9 | 0 |
| 1986 | 5 | 0 |
| 1987 | 7 | 0 |
| 1988 | 10 | 0 |
| 1989 | 8 | 0 |
| 1990 | 7 | 0 |
| 1991 | 8 | 0 |
| 1992 | 12 | 0 |
| 1993 | 9 | 0 |
| 1994 | 9 | 0 |
| 1995 | 6 | 0 |
| 1996 | 5 | 0 |
| 1997 | 4 | 0 |
| 1998 | 5 | 0 |
| 1999 | 5 | 0 |
| 2000 | 6 | 0 |
| 2001 | 12 | 5 |
| 2002 | 9 | 8 |
| 2003 | 14 | 6 |
| 2004 | 8 | 11 |
| 2005 | 6 | 4 |
| 2006 | 15 | 13 |
| 2007 | 6 | 6 |
| 2008 | 5 | 11 |
| 2009 | 11 | 13 |
| 2010 | 10 | 6 |
| 2011 | 8 | 8 |
| 2012 | 6 | 4 |
| 2013 | 7 | 4 |
| 2014 | 7 | 10 |
| 2015 | 5 | 22 |
| 2016 | 16 | 15 |
| 2017 | 14 | 27 |
| 2018 | 17 | 16 |
| 2019 | 18 | 24 |
| 2020 | 27 | 32 |
| 2021 | 25 | 39 |
| 2022 | 27 | 31 |
| 2023 | 28 | 33 |
| 2024 | 35 | 21 |
| 2025 | 27 | 29 |
| 2026 | 12 | 30 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Foreign object height measurement method and charged particle beam device4 Aug 2026US 12,699,063 B2Hitachi High-Tech Corporation
- LIB anode coating measurement with dual x-ray21 Jul 2026US 12,687,391 B2Honeywell International Inc.
- Method of determining the weight of food items23 Jun 2026US RE50,927 E1JBT Marel Corporation
- System and method to automatically count components embedded or coupled with assembly and storage equipment9 Jun 2026US 12,650,300 B2Creative Electron, Inc.
- THz measurement method and THz measurement device for surveying a measurement object, in particular a pipe2 Jun 2026US 12,644,698 B2CiTEX Holding GmbH
- X-ray transmission inspection apparatus and x-ray transmission inspection method8 Oct 2026US 2026/0309652 A1Hitachi High-Tech Science Corporation
- Method of Characterizing Layer Thickness24 Sep 2026US 2026/0287328 A13M Innovative Properties Company
- Measurement head and gauge for improved measurement stability24 Sep 2026US 2026/0287524 A1Thermo Fisher Scientific Messtechnik GmbH
- Method of Characterizing Layer Thickness17 Sep 2026US 2026/0276367 A13M Innovative Properties Company
- Radiation source unit and measurement apparatus20 Aug 2026US 2026/0243562 A1Yokogawa Electric Corporation
Most cited
By later US patents
- Method and system for low-dose three-dimensional imaging of a scene185US 6,744,848 B2Brandeis University · 2004
- X-ray thickness gauge157US 5,619,548 AOryx Instruments and Materials Corp. · 1997
- Radiation scatter apparatus and method102US 4,525,854 ATroxler Electronic Laboratories, Inc. · 1985
- X-ray compton scattering density measurement at a point within an object75US 6,563,906 B2University of New Brunswick · 2003
- Multi-technique thin film analysis tool72US 6,816,570 B2KLA-Tencor Corporation · 2004