LIB anode coating measurement with dual x-ray
AssigneeHoneywell International Inc.
InventorsGertjan Job Hofman, Sebastien Tixier
Life of this patent
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Abstract
A system includes a top scanner head configured over a coated substrate. An x-ray sensor and a second x-ray sensor scan the coated substrate. At least one of the x-ray sensor and second x-ray sensor is tuned to an energy level below an absorption peak and at least one of the x-ray sensor and second x-ray sensor is tuned to an energy level above the absorption peak. The x-ray sensor and second x-ray sensor scan a same sheet spot on the coated substrate. A bottom scanner head is configured underneath the coated substrate to provide a location for a detection of x-rays for the x-ray sensor and the second x-ray sensor.
Claims20
A method comprising:
- positioning a top scanner head above a coated substrate;
- configuring an x-ray sensor and a second x-ray sensor to scan the coated substrate, wherein at least one of the x-ray sensor and the second x-ray sensor is tuned to an energy level below an absorption peak and the at least one of the x-ray sensor and the second x-ray sensor is tuned to an energy level above the absorption peak, and wherein the x-ray sensor and the second x-ray sensor scan a same sheet spot on the coated substrate;
- and
- positioning a bottom scanner head underneath the coated substrate to provide a location for a detection of x-rays for the x-ray sensor and the second x-ray sensor.
Dependencies are inferred from the claim text.