G01B 11/306
For measuring evenness
Official title: {for measuring evenness}
G01B11/306 (For measuring evenness) appears on 515 US grants and 408 published applications in this corpus.
Search patents in G01B- Granted patents
- 515
- Published applications
- 408
- Assignees
- 399
- Inventors
- 1,223
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 4 | 0 |
| 1979 | 0 | 0 |
| 1980 | 6 | 0 |
| 1981 | 1 | 0 |
| 1982 | 2 | 0 |
| 1983 | 2 | 0 |
| 1984 | 4 | 0 |
| 1985 | 5 | 0 |
| 1986 | 2 | 0 |
| 1987 | 8 | 0 |
| 1988 | 4 | 0 |
| 1989 | 7 | 0 |
| 1990 | 6 | 0 |
| 1991 | 10 | 0 |
| 1992 | 7 | 0 |
| 1993 | 7 | 0 |
| 1994 | 10 | 0 |
| 1995 | 15 | 0 |
| 1996 | 13 | 0 |
| 1997 | 13 | 0 |
| 1998 | 19 | 0 |
| 1999 | 11 | 0 |
| 2000 | 9 | 0 |
| 2001 | 13 | 5 |
| 2002 | 9 | 14 |
| 2003 | 8 | 11 |
| 2004 | 20 | 23 |
| 2005 | 11 | 14 |
| 2006 | 16 | 20 |
| 2007 | 13 | 25 |
| 2008 | 22 | 15 |
| 2009 | 23 | 18 |
| 2010 | 10 | 8 |
| 2011 | 7 | 8 |
| 2012 | 10 | 16 |
| 2013 | 8 | 7 |
| 2014 | 5 | 19 |
| 2015 | 13 | 18 |
| 2016 | 16 | 9 |
| 2017 | 13 | 16 |
| 2018 | 16 | 21 |
| 2019 | 22 | 21 |
| 2020 | 22 | 19 |
| 2021 | 16 | 25 |
| 2022 | 13 | 19 |
| 2023 | 12 | 12 |
| 2024 | 13 | 14 |
| 2025 | 13 | 17 |
| 2026 | 5 | 14 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Testing system and method thereof15 Sep 2026US 12,736,335 B2Nanya Technology Corporation
- Coating thickness measuring device and coating device including the same30 Jun 2026US 12,669,323 B2LG Chem.Ltd.
- Apparatus and method for quantifying the surface flatness of three-dimensional point cloud data12 May 2026US 12,624,942 B2AIPhotonics Limited
- Optical device and optical measurement method27 Jan 2026US 12,535,315 B2Samsung Electronics Co., Ltd.
- Method and apparatus for detecting defects in the surface of curved articles20 Jan 2026US 12,529,659 B2Nordischer Maschinenbau Rud. Baader GmbH + Co. KG
- Device for measuring the flatness of a surface or the thickness of a flat glass panel8 Oct 2026US 2026/0309481 A1
- Structured light autocollimator24 Sep 2026US 2026/0287339 A1Fringe Metrology LLC
- Measurement device and measurement method3 Sep 2026US 2026/0259045 A1Lasertec Corporation
- Flatness inspection apparatus and flatness inspection method using the same27 Aug 2026US 2026/0251447 A1Samsung Display Co., Ltd.
- Raised access floor planarity measuring equipment and elevating mechanism16 Jul 2026US 2026/0202195 A1Vero Veria Corporation
Most cited
By later US patents
- Optical end point detection methods in semiconductor planarizing polishing processes265US 5,413,941 AMicron Technology, Inc. · 1995
- Method and system for profiling objects having multiple reflective surfaces using wavelength-tuning phase-shifting interferometry206US 6,359,692 B1Zygo Corporation · 2002
- Polishing apparatus including thickness or flatness detector196US 5,838,447 AEbara Corporation · 1998
- Method for coplanarity inspection of package or substrate warpage for ball grid arrays, column arrays, and similar structures113US 5,465,152 ARobotic Vision Systems, Inc. · 1995
- Optoelectronic system using spatiochromatic triangulation112US 6,573,998 B2Cynovad Inc. · 2003