Structured light autocollimator
AssigneeFringe Metrology LLC
InventorJoel David Berkson
Life of this patent
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AssigneeFringe Metrology LLC
InventorJoel David Berkson
Estimating the term…
A system for measurement of reflective and transparent surfaces, including a light source for generating a light pattern. The system further includes a group of primary optical elements optically coupled to the light source and the optical surface for converting the light pattern into angularly encoded light and directing it to the optical surface. The optical surface reflects the angularly encoded light back toward the primary optical elements to collect and focus the reflected angularly encoded light onto an image plane. The system further includes an aperture stop located at the image plane, configured to make an object space of the system telecentric. The system further includes secondary optical elements optically coupled to the image plane, configured to relay the image plane. The system further includes a camera sensor optically coupled to the secondary optical elements, configured to receive the image plane and measure properties of the optical surfaces.
1) A system (100) for measurement of one or more properties of an optical surface (1), the one or more properties comprising slope, form, and total thickness variation, the system (100) comprising:
Dependencies are inferred from the claim text.