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US 12,736,335 B2Granted
Testing system and method thereof
AssigneeNanya Technology Corporation
InventorCheng-Sung Lai
Life of this patent
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Abstract
A testing system includes a board conveying device for holding a testing board, a board transfer chamber connecting with the board conveying device, and an IC test chamber connecting with the board transfer chamber. The board transfer chamber includes a first sensor configured to detect a flatness of the testing board.
Claims16
A testing system, comprising:
- a board conveying device for holding a testing board;
- a board transfer chamber connecting with the board conveying device, wherein the board transfer chamber comprises a first sensor and a second sensor configured to detect a flatness of the testing board, wherein the first sensor is configured to detect a first level of one end of the testing board and the second sensor is configured to detect a second level of another end of the testing board;
- a processor configured to determine the flatness of the testing board by calculating a difference between the first level and the second level;
- and
- an IC test chamber connecting with the board transfer chamber.
2 more elements
A method of a testing system, comprising:
- moving a testing board from a board conveying device to a board transfer chamber;
- moving the testing board from the board transfer chamber to an IC test chamber;
- determining whether a flatness of the testing board is acceptable during moving the testing board, comprising:
- sensing a first level of one end of the testing board and sensing a second level of another end of the testing board during moving the testing board;
- calculating a difference between the first level and the second level;
- and
- determining whether the difference falls within a pre-determined specification;
- and
- placing a testing device on the testing board when the flatness of the testing board is determined as acceptable.
6 more elements
Dependencies are inferred from the claim text.