G01B 11/0675
Using interferometry
Official title: {using interferometry}
G01B11/0675 (Using interferometry) appears on 386 US grants and 386 published applications in this corpus.
Search patents in G01B- Granted patents
- 386
- Published applications
- 386
- Assignees
- 244
- Inventors
- 837
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 1 | 0 |
| 1978 | 3 | 0 |
| 1979 | 3 | 0 |
| 1980 | 2 | 0 |
| 1981 | 2 | 0 |
| 1982 | 0 | 0 |
| 1983 | 3 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 2 | 0 |
| 1987 | 4 | 0 |
| 1988 | 1 | 0 |
| 1989 | 3 | 0 |
| 1990 | 2 | 0 |
| 1991 | 4 | 0 |
| 1992 | 3 | 0 |
| 1993 | 2 | 0 |
| 1994 | 6 | 0 |
| 1995 | 4 | 0 |
| 1996 | 2 | 0 |
| 1997 | 7 | 0 |
| 1998 | 3 | 0 |
| 1999 | 6 | 0 |
| 2000 | 5 | 0 |
| 2001 | 3 | 1 |
| 2002 | 3 | 4 |
| 2003 | 9 | 10 |
| 2004 | 8 | 9 |
| 2005 | 8 | 21 |
| 2006 | 17 | 18 |
| 2007 | 13 | 22 |
| 2008 | 18 | 10 |
| 2009 | 14 | 14 |
| 2010 | 10 | 15 |
| 2011 | 5 | 13 |
| 2012 | 10 | 16 |
| 2013 | 9 | 13 |
| 2014 | 10 | 13 |
| 2015 | 10 | 12 |
| 2016 | 12 | 11 |
| 2017 | 15 | 14 |
| 2018 | 13 | 16 |
| 2019 | 16 | 27 |
| 2020 | 24 | 23 |
| 2021 | 15 | 17 |
| 2022 | 23 | 21 |
| 2023 | 13 | 19 |
| 2024 | 14 | 13 |
| 2025 | 15 | 13 |
| 2026 | 9 | 21 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Second harmonic generation (SHG) measurement device and measurement method using the same1 Sep 2026US 12,723,863 B2Samsung Electronics Co., Ltd.
- Method and apparatus for micromachining a sample using a focused ion beam21 Jul 2026US 12,687,386 B2Delmic IP B.V.
- Low coherence interferometry on compositions manufactured using thermal manufacturing processes9 Jun 2026US 12,650,292 B2Phyllon GmbH
- Interferometric measuring device2 Jun 2026US 12,644,693 B2Taylor Hobson Limited
- Continuous bump measurement height metrology19 May 2026US 12,631,440 B2Camtek Ltd.
- Apparatus and methods for discovery, optimization, selection, and synthesis of high-efficiency transparent opv donor-acceptor pairs1 Oct 2026US 2026/0305153 A1
- Inspection device3 Sep 2026US 2026/0259036 A1Hitachi High-Tech Corporation
- Performing detection on a target device6 Aug 2026US 2026/0227277 A1Teradyne, Inc.
- Dual comb spectroscopy for web thickness measurement16 Jul 2026US 2026/0202186 A1
- Optical interferometric measuring device and method16 Jul 2026US 2026/0202320 A1Precitec Optronik GmbH
Most cited
By later US patents
- Apparatus and method for real-time measurement of thin film layer thickness and changes thereof206US 5,450,205 AMassachusetts Institute of Technology · 1995
- Laser interferometer system and method for monitoring and controlling IC processing151US 4,618,262 AAPPLIED Materials.Inc. · 1986
- Thin film measuring device and method135US 6,236,459 B1University of Miami · 2001
- Method of cancer cell detection127US 5,995,645 AApplied Spectral Imaging Ltd. · 1999
- Optical profiler for films and substrates123US 5,042,949 A1991