H01J 3/12
Arrangements for controlling cross-section of ray or beam
Official title: Arrangements for controlling cross-section of ray or beam; Arrangements for correcting aberration of beam, e.g. due to lenses (H01J3/02, H01J3/04 take precedence)
H01J3/12 (Arrangements for controlling cross-section of ray or beam) appears on 26 US grants and 18 published applications in this corpus.
Search patents in H01J- Granted patents
- 26
- Published applications
- 18
- Assignees
- 25
- Inventors
- 74
- Latest grant
- 24 Jun 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 2 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 1 | 0 |
| 2006 | 0 | 1 |
| 2007 | 0 | 0 |
| 2008 | 1 | 1 |
| 2009 | 1 | 1 |
| 2010 | 1 | 1 |
| 2011 | 1 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 5 |
| 2014 | 3 | 2 |
| 2015 | 2 | 1 |
| 2016 | 2 | 2 |
| 2017 | 2 | 1 |
| 2018 | 0 | 0 |
| 2019 | 1 | 1 |
| 2020 | 0 | 0 |
| 2021 | 1 | 0 |
| 2022 | 1 | 1 |
| 2023 | 0 | 1 |
| 2024 | 1 | 0 |
| 2025 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Methods, mediums, and systems for identifying tunable domains for ion beam shape matching24 Jun 2025US 12,340,967 B2APPLIED Materials.Inc.
- System for manufacturing of three dimensional objects19 Nov 2024US 12,145,201 B2Joint Stock Company “Nvo Chervona Hvilya”
- Space charge insensitive electron gun designs12 Apr 2022US 11,302,510 B2KLA-Tencor Corporation
- Variable-focus magnetostatic lens4 May 2021US 10,998,158 B1Triad National Security, LLC
- Electron gun, control method and control program thereof, and three-dimensional shaping apparatus26 Feb 2019US 10,217,599 B2Technology Research Association for Future Additive Manufacturing
- Methods, mediums, and systems for identifying tunable domains for ion beam shape matching19 Jan 2023US 2023/0013095 A1APPLIED Materials.Inc.
- System for manufacturing of three dimensional objects6 Jan 2022US 2022/0001451 A1Joint Stock Company “Nvo Chervona Hvilya”
- Space Charge Insensitive Electron Gun Designs5 Dec 2019US 2019/0371564 A1KLA-Tencor Corporation
- Electron gun, control method and control program thereof, and three-dimensional shaping apparatus1 Jun 2017US 2017/0154750 A1Technology Research Association for Future Additive Manufacturing
- Charged-Particle-Beam Device13 Oct 2016US 2016/0300690 A1Hitachi High-Technologies Corporation
Most cited
By later US patents
- Aberration free lens system for electron microscope68US 5,336,891 AArch Development Corporation · 1994
- Method and apparatus for correcting chromatic aberration in charged particle beams16US 4,795,912 ATRW Inc. · 1989
- Sextupole system for the correction of spherical aberration15US 4,303,864 AThe United States of America as represented by the United States Department of Energy · 1981
- Cathode assembly with integral tabs13US 7,860,219 B2Varian Medical Systems, Inc. · 2010
- Charged particle optical systems having therein means for correcting aberrations11US 4,823,003 A1989