Charged-Particle-Beam Device
AssigneeHitachi High-Technologies Corporation
InventorsAkira IKEGAMI, Hideto DOHI, Hideyuki KAZUMI, Yoichi OSE, Naomasa SUZUKI, Momoyo ENYAMA, Ryuji NISHI, Akio TAKAOKA
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AssigneeHitachi High-Technologies Corporation
InventorsAkira IKEGAMI, Hideto DOHI, Hideyuki KAZUMI, Yoichi OSE, Naomasa SUZUKI, Momoyo ENYAMA, Ryuji NISHI, Akio TAKAOKA
Estimating the term…
Provided is a charged-particle-beam device capable of simultaneously cancelling out a plurality of aberrations caused by non-uniform distribution of the opening angle and energy of a charged particle beam. The charged-particle-beam device is provided with an aberration generation lens for generating an aberration due to the charged particle beam passing off-axis, and a corrective lens for causing the trajectory of the charged particle beam to converge on the main surface of an objective lens irrespective of the energy of the charged particle beam. The main surface of the corrective lens is disposed at a crossover position at which a plurality of charged particle beams having differing opening angles converge after passing through the aberration generation lens.
A charged-particle-beam device comprising:
Dependencies are inferred from the claim text.