H01J 2237/2823
Resolution
H01J2237/2823 (Resolution) appears on 41 US grants and 35 published applications in this corpus.
Search patents in H01J- Granted patents
- 41
- Published applications
- 35
- Assignees
- 20
- Inventors
- 96
- Latest grant
- 15 Jul 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 2 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 2 |
| 2004 | 2 | 2 |
| 2005 | 1 | 2 |
| 2006 | 1 | 2 |
| 2007 | 2 | 1 |
| 2008 | 4 | 7 |
| 2009 | 5 | 2 |
| 2010 | 2 | 6 |
| 2011 | 1 | 0 |
| 2012 | 2 | 0 |
| 2013 | 2 | 2 |
| 2014 | 3 | 0 |
| 2015 | 1 | 0 |
| 2016 | 0 | 1 |
| 2017 | 2 | 1 |
| 2018 | 1 | 1 |
| 2019 | 3 | 2 |
| 2020 | 2 | 1 |
| 2021 | 1 | 1 |
| 2022 | 0 | 1 |
| 2023 | 0 | 0 |
| 2024 | 0 | 1 |
| 2025 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Method and system for automatic zone axis alignment15 Jul 2025US 12,362,135 B2FEI Company
- Method and system for automatic zone axis alignment28 Dec 2021US 11,211,222 B2FEI Company
- Aberration measurement method and electron microscope17 Nov 2020US 10,840,058 B2JEOL Ltd.
- Charged particle beam apparatus, observation method using charged particle beam apparatus, and program1 Sep 2020US 10,763,074 B2Hitachi High-Tech Corporation
- Electron energy loss spectroscopy with adjustable energy resolution31 Dec 2019US 10,522,323 B2FEI Company
- Method for analyzing disturbing influences in a multi-beam particle microscope, associated computer program product and multi-beam particle microscope20 Jun 2024US 2024/0203684 A1
- Method and system for automatic zone axis alignment10 Mar 2022US 2022/0076917 A1FEI Company
- Method and system for automatic zone axis alignment1 Jul 2021US 2021/0202205 A1FEI Company
- Charged particle beam apparatus, observation method using charged particle beam apparatus, and program9 Jan 2020US 2020/0013583 A1Hitachi High-Technologies Corporation
- Electron energy loss spectroscopy with adjustable energy resolution10 Oct 2019US 2019/0311880 A1FEI Company
Most cited
By later US patents
- Electron/ion gun for electron or ion beams with high monochromasy or high current density35US 6,770,878 B2CEOS Corrected Electron Optical Systems GmbH · 2004
- On-line dynamic corrections adjustment method31US 6,218,671 B1Nikon Corporation · 2001
- Energy filter for charged particle beam apparatus29US 5,126,565 AU. S. Philips Corporation · 1992
- Charged-particle-beam mapping projection-optical systems and methods for adjusting same23US 6,765,217 B1Nikon Corporation · 2004
- High resolution electron energy loss spectrometer22US 5,097,126 AGatan, Inc. · 1992