H01J 2237/2527
Ions [sims]
Official title: Ions [SIMS]
H01J2237/2527 (Ions [sims]) appears on 30 US grants and 18 published applications in this corpus.
Search patents in H01J- Granted patents
- 30
- Published applications
- 18
- Assignees
- 24
- Inventors
- 75
- Latest grant
- 27 Feb 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 3 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 2 | 0 |
| 2000 | 3 | 0 |
| 2001 | 2 | 1 |
| 2002 | 1 | 0 |
| 2003 | 1 | 2 |
| 2004 | 1 | 0 |
| 2005 | 1 | 1 |
| 2006 | 1 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 1 |
| 2010 | 0 | 0 |
| 2011 | 1 | 1 |
| 2012 | 0 | 2 |
| 2013 | 1 | 0 |
| 2014 | 1 | 1 |
| 2015 | 0 | 1 |
| 2016 | 1 | 2 |
| 2017 | 2 | 1 |
| 2018 | 0 | 0 |
| 2019 | 0 | 1 |
| 2020 | 2 | 2 |
| 2021 | 1 | 1 |
| 2022 | 0 | 0 |
| 2023 | 1 | 1 |
| 2024 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Methods and systems including pulsed dual-beam charge neutralization27 Feb 2024US 11,915,901 B2Ulvac-Phi, Inc.
- Multiple beam secondary ion mass spectrometry device3 Jan 2023US 11,545,352 B2Luxembourg Institute of Science and Technology (List)
- Extraction system for charged secondary particles for use in a mass spectrometer or other charged particle device24 Aug 2021US 11,101,123 B2Luxembourg Institute of Science and Technology (List)
- Extraction system for charged secondary particles for use in a mass spectrometer or other charged particle device8 Sep 2020US 10,770,278 B2Luxembourg Institute of Science and Technology (List)
- Device and method for generating organic molecular cluster ion beam30 Jun 2020US 10,699,868 B2Korea Basic Science Institute
- Methods and systems including pulsed dual-beam charge neutralization3 Aug 2023US 2023/0245848 A1Ulvac-Phi, Inc.
- Multiple beam secondary ion mass spectrometry device8 Apr 2021US 2021/0104394 A1Luxembourg Institute of Science and Technology (List)
- Extraction System For Charged Secondary Particles For Use In A Mass Spectrometer Or Other Charged Particle Device20 Feb 2020US 2020/0058480 A1Luxembourg Institute of Science and Technology (List)
- Extraction System For Charged Secondary Particles For Use In A Mass Spectrometer Or Other Charged Particle Device20 Feb 2020US 2020/0058481 A1Luxembourg Institute of Science and Technology (List)
- Device and method for generating organic molecular cluster ion beam21 Nov 2019US 2019/0355542 A1Korea Basic Science Institute
Most cited
By later US patents
- Method and apparatus for enhancing yield of secondary ions65US 6,414,307 B1FEI Company · 2002
- Particle analyzer apparatus and method55US 5,128,543 ACharles Evans & Associates · 1992
- Process for analysis of a sample34US 6,078,045 AAtomika Instruments GmbH · 2000
- Method for testing semiconductor device23US 6,037,588 AOki Electric Industry Co., Ltd. · 2000
- Method of ultra high sensitivity hydrogen detection with slow multiply-charged ions20US 5,528,034 AThe University of Tokyo · 1996