H01J 2237/2485
Electric or electronic means
H01J2237/2485 (Electric or electronic means) appears on 196 US grants and 216 published applications in this corpus.
Search patents in H01J- Granted patents
- 196
- Published applications
- 216
- Assignees
- 76
- Inventors
- 441
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1997 | 2 | 0 |
| 1998 | 2 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 2 | 2 |
| 2002 | 1 | 4 |
| 2003 | 5 | 4 |
| 2004 | 6 | 9 |
| 2005 | 6 | 9 |
| 2006 | 10 | 24 |
| 2007 | 10 | 21 |
| 2008 | 24 | 14 |
| 2009 | 13 | 16 |
| 2010 | 11 | 5 |
| 2011 | 11 | 5 |
| 2012 | 11 | 6 |
| 2013 | 6 | 4 |
| 2014 | 7 | 8 |
| 2015 | 3 | 8 |
| 2016 | 6 | 10 |
| 2017 | 3 | 0 |
| 2018 | 2 | 9 |
| 2019 | 13 | 6 |
| 2020 | 8 | 10 |
| 2021 | 3 | 7 |
| 2022 | 4 | 12 |
| 2023 | 12 | 4 |
| 2024 | 3 | 6 |
| 2025 | 6 | 4 |
| 2026 | 5 | 9 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Plasma measuring method and plasma processing apparatus8 Sep 2026US 12,731,772 B2Tokyo Electron Limited
- Automatic electron beam calibration on periodic nanostructures28 Apr 2026US 12,614,693 B2Snap Inc.
- Sparse sampling using a programmatically randomized signal modulating a carrier signal31 Mar 2026US 12,592,358 B1Synchrotron Research, Inc.
- Distortion reduction in a multi-beam imaging system3 Mar 2026US 12,567,560 B2KLA Corporation
- Apparatus and method of generating a waveform17 Feb 2026US 12,555,745 B2Eagle Harbor Technologies, Inc.
- Apparatus and Method of Generating a Waveform8 Oct 2026US 2026/0311965 A1Eagle Harbor Technologies, Inc.
- Direct digitizing detection channel13 Aug 2026US 2026/0237596 A1ASML Netherlands B. V.
- Scanning compensation method of electron beam inspection device, product and apparatus13 Aug 2026US 2026/0237597 A1Dongfang Jingyuan Electron Limited
- Operating a particle beam apparatus30 Jul 2026US 2026/0221382 A1Carl Zeiss Microscopy GmbH
- Automatic electron beam calibration on periodic nanostructures23 Jul 2026US 2026/0213121 A1Snap Inc.
Most cited
By later US patents
- Method of detecting defects in patterned substrates227US 6,252,412 B1Schlumberger Technologies, Inc. · 2001
- High voltage resistive output stage circuit84US 10,460,910 B2Eagle Harbor Technologies, Inc. · 2019
- High voltage resistive output stage circuit82US 10,483,089 B2Eagle Harbor Technologies, Inc. · 2019
- Arbitarary waveform generation using nanosecond pulses79US 10,304,661 B2Eagle Harbor Technologies, Inc. · 2019
- Rate enhanced pulsed DC sputtering system79US 9,812,305 B2Advanced Energy Industries, Inc. · 2017