H01J 2237/225
Displaying image using synthesised colours
H01J2237/225 (Displaying image using synthesised colours) appears on 25 US grants and 25 published applications in this corpus.
Search patents in H01J- Granted patents
- 25
- Published applications
- 25
- Assignees
- 18
- Inventors
- 80
- Latest grant
- 19 Aug 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 2 |
| 2007 | 0 | 0 |
| 2008 | 1 | 1 |
| 2009 | 1 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 2 |
| 2013 | 1 | 0 |
| 2014 | 1 | 2 |
| 2015 | 1 | 4 |
| 2016 | 0 | 0 |
| 2017 | 2 | 1 |
| 2018 | 2 | 1 |
| 2019 | 0 | 1 |
| 2020 | 3 | 4 |
| 2021 | 4 | 3 |
| 2022 | 2 | 1 |
| 2023 | 2 | 1 |
| 2024 | 0 | 0 |
| 2025 | 1 | 0 |
| 2026 | 0 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method of generating a crystalline orientation map of a surface portion of a sample and computer program product19 Aug 2025US 12,394,588 B2Carl Zeiss Microscopy GmbH
- Charged particle microscope scan masking for three-dimensional reconstruction29 Aug 2023US 11,741,730 B2FEI Company
- Method of examining a sample using a charged particle microscope7 Mar 2023US 11,598,733 B2FEI Company
- Method of examining a sample using a charged particle microscope, wherein an electron energy-loss spectroscopy (EELS) spectrum is acquired16 Aug 2022US 11,417,497 B2FEI Company
- Method of examining a sample using a charged particle microscope10 May 2022US 11,327,032 B2FEI Company
- Charged particle beam device, image processing method, and image processing program30 Jul 2026US 2026/0221379 A1Hitachi High-Tech Corporation
- Particle beam apparatus with moveable object stage7 May 2026US 2026/0128255 A1Carl Zeiss Microscopy GmbH
- Method of generating a crystalline orientation map of a surface portion of a sample and computer program product8 Jun 2023US 2023/0178332 A1Carl Zeiss Microscopy GmbH
- Charged particle microscope scan masking for three-dimensional reconstruction29 Dec 2022US 2022/0414361 A1FEI Company
- Focused ion beam apparatus25 Mar 2021US 2021/0090854 A1Hitachi High-Tech Science Corporation
Most cited
By later US patents
- Scanning electron microscope44US 5,608,218 AHitachi, Ltd. · 1997
- Scanning interference electron microscope15US 7,417,227 B2Hitachi High-Technologies Corporation · 2008
- Apparatus for displaying a sample image12US 5,393,976 ATopcon Corporation · 1995
- Method and apparatus for image formation11US 4,560,872 ACommonwealth Scientific and Industrial Research Organization · 1985
- Scanning electron microscope and scanning transmission electron microscope10US 8,878,130 B2Hitachi High-Technologies Corporation · 2014