H01J 2201/30415
Needle shaped
Official title: needle shaped
H01J2201/30415 (Needle shaped) appears on 25 US grants and 26 published applications in this corpus.
Search patents in H01J- Granted patents
- 25
- Published applications
- 26
- Assignees
- 24
- Inventors
- 80
- Latest grant
- 21 Oct 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2009 | 0 | 2 |
| 2010 | 0 | 2 |
| 2011 | 2 | 2 |
| 2012 | 1 | 1 |
| 2013 | 0 | 3 |
| 2014 | 2 | 0 |
| 2015 | 2 | 1 |
| 2016 | 0 | 0 |
| 2017 | 3 | 1 |
| 2018 | 1 | 1 |
| 2019 | 1 | 3 |
| 2020 | 1 | 1 |
| 2021 | 3 | 2 |
| 2022 | 0 | 3 |
| 2023 | 3 | 1 |
| 2024 | 3 | 1 |
| 2025 | 3 | 2 |
By publication year.
Recent patents
- Extreme-ultraviolet light source device using electron beams21 Oct 2025US 12,451,316 B2Worldbeam Solution Co., Ltd.
- Field emission electron source, electron optical device, and manufacturing method26 Aug 2025US 12,400,820 B2Hitachi, Ltd.
- Carbon nanomaterial functionalized needle tip modified with low work function material and preparation method thereof27 May 2025US 12,313,653 B2National Center for Nanoscience and Technology
- Emitter, electron gun in which same is used, electronic device in which same is used, and method for manufacturing same14 May 2024US 11,984,294 B2National Institute for Materials Science
- Field-emission type electron source and charged particle beam device using the same19 Mar 2024US 11,935,720 B1
- Emitter, electron gun and electronic apparatus, and emitter manufacturing method4 Dec 2025US 2025/0372334 A1
- Field Emission Electron Source, Electron Optical Device, and Manufacturing Method29 May 2025US 2025/0174422 A1Hitachi, Ltd.
- Emitter, electron gun in which same is used, electronic device in which same is used, and method for manufacturing same7 Mar 2024US 2024/0079198 A1National Institute for Materials Science
- Extreme-ultraviolet light source device using electron beams20 Apr 2023US 2023/0122253 A1University-Industry Cooperation Group of Kyung Hee University
- Emitter, electron gun in which same is used, electronic device in which same is used, and method for manufacturing same22 Dec 2022US 2022/0406552 A1National Institute for Materials Science
Most cited
By later US patents
- Electron beam device, cold field emitter, and method for regeneration of a cold field emitter4US 9,847,208 B1ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH · 2017
- Field emission electron source having a carbon nanotube needle2US 8,013,505 B2Hon Hai Precision Industry Co., Ltd. · 2011
- Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus2US 9,773,634 B2Hitachi High-Tech Science Corporation · 2017
- Method of producing microrods for electron emitters, and associated microrods and electron emitters1US 11,651,924 B1FEI Company · 2023
- Emitter, electron gun in which same is used, electronic device in which same is used, and method for manufacturing same1US 11,915,920 B2National Institute for Materials Science · 2024