G06F 11/2736
Using a dedicated service processor for test
Official title: {using a dedicated service processor for test}
G06F11/2736 (Using a dedicated service processor for test) appears on 200 US grants and 66 published applications in this corpus.
Search patents in G06F- Granted patents
- 200
- Published applications
- 66
- Assignees
- 90
- Inventors
- 485
- Latest grant
- 12 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 3 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 1 | 0 |
| 1982 | 2 | 0 |
| 1983 | 0 | 0 |
| 1984 | 2 | 0 |
| 1985 | 3 | 0 |
| 1986 | 2 | 0 |
| 1987 | 2 | 0 |
| 1988 | 1 | 0 |
| 1989 | 4 | 0 |
| 1990 | 7 | 0 |
| 1991 | 7 | 0 |
| 1992 | 5 | 0 |
| 1993 | 11 | 0 |
| 1994 | 9 | 0 |
| 1995 | 11 | 0 |
| 1996 | 14 | 0 |
| 1997 | 12 | 0 |
| 1998 | 12 | 0 |
| 1999 | 11 | 0 |
| 2000 | 8 | 0 |
| 2001 | 6 | 0 |
| 2002 | 2 | 4 |
| 2003 | 2 | 2 |
| 2004 | 3 | 2 |
| 2005 | 1 | 2 |
| 2006 | 3 | 3 |
| 2007 | 3 | 2 |
| 2008 | 2 | 4 |
| 2009 | 2 | 0 |
| 2010 | 3 | 3 |
| 2011 | 2 | 1 |
| 2012 | 2 | 1 |
| 2013 | 3 | 1 |
| 2014 | 1 | 5 |
| 2015 | 1 | 1 |
| 2016 | 3 | 5 |
| 2017 | 3 | 4 |
| 2018 | 7 | 4 |
| 2019 | 5 | 4 |
| 2020 | 3 | 3 |
| 2021 | 3 | 3 |
| 2022 | 1 | 5 |
| 2023 | 2 | 3 |
| 2024 | 4 | 1 |
| 2025 | 2 | 2 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Semiconductor memory device-directed error check and scrub12 May 2026US 12,625,766 B2Micron Technology, Inc.
- Systems, apparatuses, and methods for autonomous functional testing of a processor18 Mar 2025US 12,253,925 B2Intel Corporation
- Systems and methods for parallel testing of multiple namespaces located in a plurality of devices under test4 Feb 2025US 12,216,559 B2Advantest Corporation
- Vehicle apparatus including verification apparatus24 Dec 2024US 12,174,726 B2Mitsubishi Electric Corporation
- Heterogeneous test equipment interfacing apparatus for weapon system environment/reliability test, environment test system, and data intermediate apparatus29 Oct 2024US 12,130,600 B2Agency for Defense Development
- Semiconductor memory device-directed error check and scrub17 Sep 2026US 2026/0277742 A1Micron Technology, Inc.
- Apparatus and method for exporting machine check error (mce) data through soc network interfaces11 Dec 2025US 2025/0377997 A1
- Semiconductor memory device-directed error check and scrub24 Apr 2025US 2025/0130897 A1Micron Technology, Inc.
- Ser-des test chip and method for managing inter-operability data rate range10 Oct 2024US 2024/0338287 A1Samsung Electronics Co., Ltd.
- Multiple-name-space test systems and methods17 Aug 2023US 2023/0259435 A1Advantest Corporation
Most cited
By later US patents
- Computer system manager for monitoring events and operating parameters and generating alerts234US 5,367,670 ACompaq Computer Corporation · 1994
- Computer system and monitoring method233US 5,432,715 AHitachi, Ltd. · 1995
- Fault-tolerant computer system with auto-restart after power-fall228US 5,317,752 ATandem Computers Incorporated · 1994
- Fault-tolerant computer system with online recovery and reintegration of redundant components227US 5,295,258 ATandem Computers Incorporated · 1994
- Graphical user interface for computer management system and an associated management information base182US 5,559,958 ACompaq Computer Corporation · 1996