Systems and methods for parallel testing of multiple namespaces located in a plurality of devices under test
AssigneeAdvantest Corporation
InventorsSrdjan Malisic, Chi Yuan
Life of this patent
Estimating the term…
Loading patent…
AssigneeAdvantest Corporation
InventorsSrdjan Malisic, Chi Yuan
Estimating the term…
Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a multiple-name-space testing system comprises a load board, testing electronics, and a namespace testing tracker. The load board is configured to couple with a plurality of devices under test (DUTs). The testing electronics are configured to test the plurality of DUTs, wherein the testing electronics are coupled to the load board. The controller is configured to direct testing of multiple-name-spaces across the plurality of DUTs at least in part in parallel. The controller can be coupled to the testing electronics. The namespace testing tracker is configured to track testing of the plurality of DUTs, including the testing of the multiple-name-spaces across the plurality of DUTs at least in part in parallel. In one embodiment, the DUTs are NVMe SSD devices.
A multiple-name-space testing system comprising:
A multiple-name-space testing system comprising:
A multiple-name-space testing method comprising:
Dependencies are inferred from the claim text.