G05B 2219/32224
Identify parameters with highest probability of failure
G05B2219/32224 (Identify parameters with highest probability of failure) appears on 8 US grants and 11 published applications in this corpus.
Search patents in G05B- Granted patents
- 8
- Published applications
- 11
- Assignees
- 14
- Inventors
- 28
- Latest grant
- 25 Jun 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 1 | 1 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 2 |
| 2009 | 1 | 0 |
| 2010 | 1 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 2 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 1 | 0 |
| 2019 | 0 | 1 |
| 2020 | 0 | 0 |
| 2021 | 1 | 1 |
| 2022 | 0 | 2 |
| 2023 | 0 | 0 |
| 2024 | 2 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Manufacturing condition output apparatus, quality management system, and storage medium25 Jun 2024US 12,019,434 B2Kabushiki Kaisha Toshiba
- Faulty variable identification technique for data-driven fault detection within a process plant23 Apr 2024US 11,966,217 B2Emerson Process Management Power & Water Solutions, Inc.
- Data management and mining to correlate wafer alignment, design, defect, process, tool, and metrology data10 Aug 2021US 11,088,039 B2APPLIED Materials.Inc.
- Adaptive value capture for process monitoring27 Feb 2018US 9,905,483 B2Advantest Corporation
- Knowledge-based statistical method and system to determine reliability compatibility for semiconductor integrated circuits9 Feb 2010US 7,660,699 B2Semiconductor Manufacturing International (Shanghai) Corporation
- Faulty Variable Identification Technique for Data-Driven Fault Detection Within A Process Plant23 Jun 2022US 2022/0197260 A1Emerson Process Management Power & Water Solutions, Inc.
- Manufacturing condition output apparatus, quality management system, and storage medium10 Mar 2022US 2022/0075360 A1Kabushiki Kaisha Toshiba
- Maintenance Recommendation System and Maintenance Recommendation Method30 Dec 2021US 2021/0405610 A1Hitachi, Ltd.
- Data management and mining to correlate wafer alignment, design, defect, process, tool, and metrology data25 Apr 2019US 2019/0122944 A1APPLIED Materials.Inc.
- Adaptive value capture for process monitoring9 Jul 2015US 2015/0193378 A1Advantest (Singapore) Pte Ltd
Most cited
By later US patents
- Method of and apparatus for extracting abnormal factors in a processing operation26US 6,061,640 AMatsushita Electric Industrial Co., Ltd. · 2000
- Maintenance management of a machine11US 7,496,475 B2Solar Turbines Incorporated · 2009
- Yield/quality improvement using calculated failure rate derived from multiple component level parameters3US 6,947,871 B2Hitachi Global Storage Technologies Netherlands B. V. · 2005
- Adaptive value capture for process monitoring1US 9,905,483 B2Advantest Corporation · 2018