Knowledge-based statistical method and system to determine reliability compatibility for semiconductor integrated circuits

A method for manufacturing more than two products, the method comprising:

• providing a first group, the first group being characterized by at least a first design and a first set of processes;
• providing a second group, the second group being characterized by at least a second design and a second set of processes;
• identifying at least a first reliability characteristic associated with the first group and identifying at least a second reliability characteristic associated with the second group;
• determining a first reliability function R1(t) of the first group, the first reliability function being associated with a time variable and the first reliability characteristic;
• determining second reliability function R2(t) of the second group, the second reliability function being associated with the time variable and the second reliability characteristic;
• determining a failure probability density function associated with the first reliability function and the second reliability function;
• using a computer, calculating a failure probability f(t) for the first group and the second group from the failure probability density function from an initial time period to an infinite time period;
• determining the first reliability characteristic of the first group using at least the failure probability of the first group and the second group;
• and
• determining the second reliability characteristic of the second group using at least the index associated with the failure probability of the first group and the second group.

A computer based system for manufacturing more than two products, the system comprising:

• one or more memories configured to be readable by a computer, the one or more memories including one or more computer codes stored on the one or more memories, the one or more computer codes being configured to be executable by the computer system, the one or more computer codes including:
• one or more codes directed to receiving a first group of electronic information, the first group of electronic information being characterized by at least a first design and a first set of processes;
• one or more codes directed to receiving a second group of electronic information, the second group of electronic information being characterized by at least a first design and a first set of processes;
• one or more codes directed to identifying at least a first reliability characteristic associated with the first group and identifying at least a second reliability characteristic associated with the second group;
• one or more codes directed to determining a first reliability function R1(t) of the first group, the first reliability density function being associated with a time variable and the first reliability characteristic;
• one or more codes directed to determining second reliability function R2(t) of the second group, the second reliability density function being associated with the time variable and the second reliability characteristic;
• one or more codes directed to determining a failure probability density function associated with the first reliability function and the second reliability function;
• one or more codes directed to calculating a failure probability f(t) for the first group and the second group from the failure probability density function from an initial time period to an infinite time period;
• one or more codes directed to determining the first reliability characteristic of the first group using at least the failure probability of the first group and the second group;
• and
• one or more codes directed to determining the second reliability characteristic of the second group using at least the index associated with the failure probability of the first group and the second group.