G05B 2219/32217
Finish defect surfaces on workpiece
G05B2219/32217 (Finish defect surfaces on workpiece) appears on 20 US grants and 20 published applications in this corpus.
Search patents in G05B- Granted patents
- 20
- Published applications
- 20
- Assignees
- 16
- Inventors
- 74
- Latest grant
- 11 Nov 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 1 |
| 2004 | 1 | 1 |
| 2005 | 1 | 0 |
| 2006 | 0 | 1 |
| 2007 | 1 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 2 |
| 2011 | 0 | 0 |
| 2012 | 1 | 1 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 1 | 1 |
| 2018 | 0 | 0 |
| 2019 | 0 | 1 |
| 2020 | 0 | 1 |
| 2021 | 2 | 4 |
| 2022 | 2 | 2 |
| 2023 | 2 | 3 |
| 2024 | 4 | 2 |
| 2025 | 3 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Method for checking workpieces, checking facility and treatment facility11 Nov 2025US 12,468,996 B2Dürr Systems AG
- Process control system and operating method therefor14 Oct 2025US 12,442,086 B2Posco
- Surface data, acquisition, storage, and assessment system2 Sep 2025US 12,405,588 B1EctoScan Systems, LLC
- Method and electronic device for monitoring a manufacturing of a metal product, related computer program and installation8 Oct 2024US 12,111,642 B2ArcelorMittal
- Method for checking workpieces, checking facility and treatment facility12 Mar 2024US 11,928,628 B2Dürr Systems AG
- Method for checking workpieces, checking facility and treatment facility11 Jul 2024US 2024/0232760 A9Dürr Systems AG
- Method for checking workpieces, checking facility and treatment facility25 Apr 2024US 2024/0135289 A1Dürr Systems AG
- Robotic Method of Repair7 Sep 2023US 2023/0278225 A1ABB Schweiz AG
- Defect identification using machine learning in an additive manufacturing system17 Aug 2023US 2023/0258575 A1Sigma Labs, Inc.
- Process control system and operating method therefor25 May 2023US 2023/0160071 A1Posco
Most cited
By later US patents
- Use of contamination-free manufacturing data in fault detection and classification as well as in run-to-run control35US 6,560,504 B1Advanced Micro Devices, Inc. · 2003
- Determination of a process flow based upon fault detection analysis18US 6,740,534 B1Advanced Micro Devices, Inc. · 2004
- Method of and apparatus for finishing a surface of workpiece16US 5,477,268 AMazda Motor Corporation · 1995
- Method and system for engineering change implementation12US 7,299,102 B22007
- Surface data acquisition, storage, and assessment system11US 9,599,461 B2EctoScan Systems, LLC · 2017