Process control system and operating method therefor

A process control system comprising:

• a storage device storing a calculation module generating thickness information about an internal defect layer included in a carbon steel product, based on at least one of a component, a cooling rate, a phase fraction, or a temperature of the carbon steel product;
• a communication unit connected to a network;
• and
• a processor transmitting at least one of the thickness information about the internal defect layer or control data for controlling an etching process removing at least a portion of the internal defect layer, to an external server controlling the etching process, through the communication unit;
• wherein the calculation module comprises a first module calculating a phase fraction before winding the carbon steel product, a second module calculating a change in temperature of the carbon steel product, and a third module calculating a thickness of the internal defect layer included in the carbon steel product,
• wherein the processor compares a thickness of the internal defect layer calculated by the third module using at least one of a change in temperature calculated according to the elapsed time after winding the carbon steel product, the component of the carbon steel product, or an oxygen partial pressure around the carbon steel product, and a thickness of the internal defect layer measured from the carbon steel product, to train the third module,
• wherein the third module calculates a thickness of the internal defect layer in each of a plurality of regions distinguished in a length direction of the carbon steel product.

A process control system comprising:

• a storage device storing a calculation module generating thickness information about an internal defect layer included in a carbon steel product, based on at least one of a component, a cooling rate, a phase fraction, or a temperature of the carbon steel product;
• a communication unit connected to a network;
• and
• a processor transmitting at least one of the thickness information about the internal defect layer or control data for controlling an etching process removing at least a portion of the internal defect layer, to an external server controlling the etching process, through the communication unit;
• wherein the calculation module comprises a first module calculating a phase fraction before winding the carbon steel product, a second module calculating a change in temperature of the carbon steel product, a third module calculating a thickness of the internal defect layer included in the carbon steel product, a fourth module calculating a thickness of the internal defect layer to be removed in the etching process, based on the control data, and a fifth module generating the control data,
• wherein the processor compares a thickness of the internal defect layer calculated by the fourth module using the control data measured by the external server from an etching device performing the etching process, and a thickness of the residual internal defect layer measured from the pickled carbon steel product on which the etching process is completed, to train the calculation module.