G05B 2219/32199
If number of errors grow, augment sampling rate for testing
G05B2219/32199 (If number of errors grow, augment sampling rate for testing) appears on 15 US grants and 18 published applications in this corpus.
Search patents in G05B- Granted patents
- 15
- Published applications
- 18
- Assignees
- 13
- Inventors
- 48
- Latest grant
- 24 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 1 |
| 2003 | 1 | 0 |
| 2004 | 2 | 1 |
| 2005 | 1 | 0 |
| 2006 | 1 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 1 |
| 2009 | 1 | 2 |
| 2010 | 0 | 0 |
| 2011 | 1 | 0 |
| 2012 | 1 | 1 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 1 |
| 2018 | 0 | 1 |
| 2019 | 2 | 2 |
| 2020 | 1 | 0 |
| 2021 | 0 | 1 |
| 2022 | 0 | 2 |
| 2023 | 1 | 3 |
| 2024 | 0 | 1 |
| 2025 | 1 | 0 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method for automatically adjusting manufacturing limits prescribed on an assembly line24 Mar 2026US 12,585,252 B2Instrumental, Inc.
- Method for controlling a production process for producing components30 Sep 2025US 12,429,859 B2GKN Sinter Metals Engineering GmbH
- Fab management with dynamic sampling plans, optimized wafer measurement paths and optimized wafer transport, using quantum computing28 Mar 2023US 11,615,974 B2KLA Corporation
- Auto defect screening using adaptive machine learning in semiconductor device manufacturing flow25 Aug 2020US 10,754,309 B2APPLIED Materials.Inc.
- Auto defect screening using adaptive machine learning in semiconductor device manufacturing flow30 Jul 2019US 10,365,617 B2DMO Systems Limited
- Method for automatically adjusting manufacturing limits prescribed on an assembly line2 Jul 2026US 2026/0186469 A1Instrumental, Inc.
- Method and System for Measuring Components and Program14 Mar 2024US 2024/0085890 A1Carl Zeiss Industrielle Messtechnik GmbH
- Chemical Production21 Dec 2023US 2023/0409015 A1BASF SE
- Chemical Production7 Dec 2023US 2023/0390725 A1BASF SE
- Method for automatically adjusting manufacturing limits prescribed on an assembly line18 May 2023US 2023/0152785 A1Instrumental, Inc.
Most cited
By later US patents
- Method and apparatus for determining a sampling plan based on defectivity21US 6,687,561 B1Advanced Micro Devices, Inc. · 2004
- Self-improving work instruction system17US 5,541,846 A1996
- Systems, methods and computer program products for constructing sampling plans for items that are manufactured6US 6,636,818 B1Becton, Dickinson and Company · 2003
- Systems, methods and computer program products for constructing sampling plans for items that are manufactured6US 6,920,405 B2Becton, Dickinson and Company · 2005
- Method and apparatus for adaptive sampling based on process covariance6US 6,985,825 B1Advanced Micro Devices, Inc. · 2006