Method and System for Measuring Components and Program
AssigneeCarl Zeiss Industrielle Messtechnik GmbH
InventorsGünter Haas, Florian Dotschkal
Life of this patent
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Abstract
A method for measuring components produced by a production device includes selecting components to be measured from multiple components. The selection is made according to at least one selection parameter. The at least one selection parameter includes a sampling frequency. The method includes determining at least one production parameter. The at least one production parameter includes a production condition. The method includes adapting the sampling frequency based on the production parameter or a change in the production parameter. Adapting includes reducing the sampling frequency in response to one or more production parameters not changing by more than a predetermined amount.
Claims21
1-15. (canceled)
A method for measuring components produced by a production device, the method comprising:
- selecting components to be measured from a plurality of components, the selection being made according to at least one selection parameter, wherein the at least one selection parameter includes a sampling frequency;
- determining at least one production parameter, wherein the at least one production parameter includes a production condition;
- and
- adapting the sampling frequency based on the production parameter or a change in the production parameter, including reducing the sampling frequency in response to one or more production parameters not changing by more than a predetermined amount.
A method for measuring components produced by a production device, the method comprising:
- selecting components to be measured from a plurality of components, the selection is made according to at least one selection parameter,
- determining at least one production parameter, and
- adapting at least one selection parameter based on the production parameter or a change in the production parameter, wherein:
- the production-parameter-related adaptation is implemented with a time offset, and
- the production-parameter-related adaptation is implemented at a time at which the component produced using the production parameter is measured.
A non-transitory computer-readable medium comprising instructions including:
- selecting components to be measured from a plurality of components, the selection being made according to at least one selection parameter,
- determining at least one production parameter, and
- adapting the at least one selection parameter based on the production parameter or a change in the production parameter,
- wherein:
- the production-parameter-related adaptation is implemented with a time offset, and
- the adaptation of the selection parameter is implemented at a time at which the component produced using the production parameter is measured.
A method for measuring components produced by a production device, the method comprising:
- selecting components to be measured from a plurality of components, wherein selecting is according to at least one selection parameter,
- determining at least one production parameter,
- adapting the at least one selection parameter on a basis of the production parameter or a change in the production parameter,
- selecting components to be measured from a predetermined number of components, wherein selecting is accordance with the selection parameter that has been adapted in production-parameter-related fashion,
- creating component-specific measurement data by measuring the components selected in accordance with selecting components to be measured from a predetermined number of components using a coordinate measuring machine and analysis of the measurement data, and
- renewing a purely result-related adaptation of the at least one selection parameter based on a result of an evaluation in accordance with creating component-specific measurement data.
A system for measuring components produced by a production device, the system comprising:
- at least one coordinate measuring machine;
- and
- at least one evaluation and control device, wherein the system is configured to carry out a measurement method including:
- selecting components to be measured from a plurality of components, wherein selecting in accordance to at least one selection parameter,
- determining at least one production parameter, and
- adapting at least one selection parameter on a basis of the production parameter or a change in the production parameter, wherein:
- the adapting is implemented with a time offset, and
- the adapting the at least one selection parameter is implemented at a time at that the component produced using the production parameter is measured.
Dependencies are inferred from the claim text.