G05B 2219/32182
If state of tool, product deviates from standard, adjust system, feedback
G05B2219/32182 (If state of tool, product deviates from standard, adjust system, feedback) appears on 100 US grants and 88 published applications in this corpus.
Search patents in G05B- Granted patents
- 100
- Published applications
- 88
- Assignees
- 72
- Inventors
- 276
- Latest grant
- 28 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 1 | 0 |
| 1994 | 2 | 0 |
| 1995 | 2 | 0 |
| 1996 | 1 | 0 |
| 1997 | 5 | 0 |
| 1998 | 2 | 0 |
| 1999 | 2 | 0 |
| 2000 | 2 | 0 |
| 2001 | 0 | 0 |
| 2002 | 4 | 6 |
| 2003 | 6 | 4 |
| 2004 | 4 | 7 |
| 2005 | 9 | 5 |
| 2006 | 8 | 4 |
| 2007 | 4 | 5 |
| 2008 | 2 | 3 |
| 2009 | 2 | 4 |
| 2010 | 3 | 0 |
| 2011 | 1 | 2 |
| 2012 | 0 | 5 |
| 2013 | 1 | 2 |
| 2014 | 2 | 4 |
| 2015 | 3 | 3 |
| 2016 | 3 | 3 |
| 2017 | 2 | 1 |
| 2018 | 4 | 4 |
| 2019 | 6 | 3 |
| 2020 | 2 | 3 |
| 2021 | 2 | 6 |
| 2022 | 4 | 2 |
| 2023 | 2 | 4 |
| 2024 | 4 | 4 |
| 2025 | 3 | 2 |
| 2026 | 2 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- System and method for defect mitigation using data analysis28 Apr 2026US 12,613,515 B2Orbotech Ltd.
- Modelling and prediction system with auto machine learning in the production of memory devices17 Feb 2026US 12,555,213 B2SanDisk Technologies LLC
- Workpiece machining method and workpiece machining device23 Sep 2025US 12,422,814 B2Shibaura Machine Co., Ltd.
- Systems, methods, and media for manufacturing processes1 Jul 2025US 12,346,088 B2Nanotronics Imaging, Inc.
- Semiconductor analysis system1 Jul 2025US 12,347,707 B2Hitachi High-Tech Corporation
- Qa system and method11 Jun 2026US 2026/0162247 A1JBT Marel Corporation
- Beverage filler management system and method5 Mar 2026US 2026/0062272 A1JBT Marel Corporation
- Systems, Methods, and Media for Manufacturing Processes23 Oct 2025US 2025/0328122 A1Nanotronics Imaging, Inc.
- Systems, Methods, and Media for Manufacturing Processes27 Mar 2025US 2025/0104274 A1Nanotronics Imaging, Inc.
- Modelling and prediction of virtual quality control data incorporating area location in the production of memory devices21 Nov 2024US 2024/0387295 A1SanDisk Technologies LLC
Most cited
By later US patents
- Semiconductor manufacturing process monitoring544US 7,720,560 B2International Business Machines Corporation · 2010
- Process control method for improving manufacturing operations163US 5,440,478 AMercer Forge Company · 1995
- Method for setting and adjusting process parameters to maintain acceptable critical dimensions across each die of mass-produced semiconductor wafers154US 5,655,110 AAdvanced Micro Devices, Inc. · 1997
- Apparatus and method for registration control of assembled components147US 5,359,525 AKimberly-Clark Corporation · 1994
- Computer system for quality control correlations113US 5,461,570 AJohnson & Johnson Vision Products, Inc. · 1995