System and method for defect mitigation using data analysis
AssigneeOrbotech Ltd.
InventorsNava Shpaisman, Bronislav Kupershtein
Life of this patent
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AssigneeOrbotech Ltd.
InventorsNava Shpaisman, Bronislav Kupershtein
Estimating the term…
A method for defect mitigation is disclosed. The method may include receiving defect data for one or more defects of one or more samples. The defect data may include a defect location, a defect size, a defect shape, or a relationship between the defect and a component of the one or more samples. The method may include identifying at least one defect as a disqualifying defect based on the received defect data and one or more predetermined thresholds. Upon identifying the defect as a disqualifying defect, the method may include generating a tool readable index configured to cause one or more downstream fabrications tool to adjust one or more downstream fabrication steps corresponding to the disqualifying defect based on the generated tool readable index. The method may include providing the generated tool readable index to the one or more downstream fabrication tool.
A system, the system comprising:
A system, the system comprising:
A method, the method comprising:
Dependencies are inferred from the claim text.