G05B 2219/32179
Quality control, monitor production tool with multiple sensors
G05B2219/32179 (Quality control, monitor production tool with multiple sensors) appears on 77 US grants and 113 published applications in this corpus.
Search patents in G05B- Granted patents
- 77
- Published applications
- 113
- Assignees
- 76
- Inventors
- 305
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2002 | 0 | 1 |
| 2003 | 0 | 3 |
| 2004 | 4 | 1 |
| 2005 | 4 | 4 |
| 2006 | 3 | 3 |
| 2007 | 0 | 2 |
| 2008 | 1 | 2 |
| 2009 | 2 | 4 |
| 2010 | 2 | 2 |
| 2011 | 2 | 5 |
| 2012 | 0 | 0 |
| 2013 | 1 | 3 |
| 2014 | 0 | 2 |
| 2015 | 2 | 5 |
| 2016 | 1 | 4 |
| 2017 | 1 | 4 |
| 2018 | 6 | 5 |
| 2019 | 4 | 7 |
| 2020 | 4 | 10 |
| 2021 | 11 | 13 |
| 2022 | 5 | 5 |
| 2023 | 7 | 7 |
| 2024 | 5 | 5 |
| 2025 | 9 | 11 |
| 2026 | 3 | 5 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Part, sensor, and metrology data integration29 Sep 2026US 12,748,407 B2APPLIED Materials.Inc.
- Quality monitoring of industrial processes28 Apr 2026US 12,613,514 B2Gestamp AutomocióN, S.A.
- Yarn spindle quality control method based on knowledge graph, electronic device, and storage medium20 Jan 2026US 12,530,024 B2Zhejiang Hengyi Petrochemical Co., Ltd.
- Abnormality symptom analyzing device16 Dec 2025US 12,498,704 B2Mitsubishi Electric Corporation
- Multi-sensor test device for quality control scanning11 Nov 2025US 12,467,875 B2Micron Technology, Inc.
- Feedback control system and control method therefor2 Jul 2026US 2026/0186473 A1Ls Electric Co., Ltd.
- Manufacturing system with remote determination of quality control result during production2 Jul 2026US 2026/0186474 A1The Boeing Company
- Multi-sensor test device for quality control scanning26 Feb 2026US 2026/0056132 A1Micron Technology, Inc.
- Recording System and Method for the Automated Documentation of Defects in Semi-finished Products5 Feb 2026US 2026/0036561 A1Bayerische Motoren Werke Aktiengesellschaft
- Method and device for manufacturing a multiplicity of components with at least one electrical feedthrough and an information store, component, and method and device for the further processing of such components29 Jan 2026US 2026/0032829 A1Schott AG
Most cited
By later US patents
- Semiconductor manufacturing process monitoring544US 7,720,560 B2International Business Machines Corporation · 2010
- System and software for data collection and process control in semiconductor manufacturing and method thereof250US 6,970,758 B1Advanced Micro Devices, Inc. · 2005
- Production management system, client in the production management system, production management method in the production management system, data retrieval method in the production management system, and computer product63US 6,801,822 B1Ricoh Company, Ltd. · 2004
- Fault detection and classification (FDC) using a run-to-run controller45US 7,477,960 B2Tokyo Electron Limited · 2009
- Method and apparatus for run-to-run control of trench profiles18US 6,728,591 B1Advanced Micro Devices, Inc. · 2004