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US 12,467,875 B2Granted
Multi-sensor test device for quality control scanning
AssigneeMicron Technology, Inc.
InventorTheodore G. Doros
Life of this patent
Estimating the term…
Abstract
In some implementations, a test device may initiate a set of measurements by a set of sensors of the test device and of a device under test (DUT), wherein the DUT is a memory device. The test device may obtain the set of measurements of the DUT from the set of sensors based on initiating the set of measurements. The test device may analyze the set of measurements of the DUT, using a first model, to identify one or more defects present with the DUT. The test device may determine, using a second model, that the one or more defects present with the DUT satisfy a failure threshold. The test device may provide, based on the failure threshold being satisfied for the DUT, an output indicating that the failure threshold is satisfied for the DUT.
Claims25
A test device, comprising:
- an enclosure;
- a set of sensors disposed within the enclosure;
- a set of openings in the enclosure aligned to the set of sensors;
- and
- a controller coupled to the set of sensors configured to:
- initiate a set of measurements including at least one imaging measurement and at least one non-imaging measurement, by the set of sensors, of an object using the set of sensors;
- obtain the set of measurements of the object from the sensors based on initiating the set of measurements;
- analyze the set of measurements of the object, using a computer vision model, to identify whether one or more defects are present with the object;
- apply an artificial intelligence model of object failure to the at least one imaging measurement and the at least one non-imaging measurement to determine whether a failure threshold is satisfied for the object based on determining whether the one or more defects are present with the object;
- and
- provide, based on whether the failure threshold is satisfied for the object:
- first output,
- the first output indicating that the failure threshold is not satisfied for the object, and
- the first output including a classification of at least one defect present with the object determined based at least in part on a defect classification model, or
- second output,
- the second output identifying a classification of a failure of the object based on the failure threshold being satisfied for the object.
13 more elements
A method, comprising:
- initiating, by a set of sensors of a test device comprising an enclosure, the set of sensors disposed within the enclosure, and a set of openings in the enclosure aligned to the set of sensors, a set of measurements including at least one imaging measurement and at least one non-imaging measurement of an object using the set of sensors;
- obtaining, by the test device, the set of measurements of the object from the set of sensors based on initiating the set of measurements;
- analyzing, by the test device, the set of measurements of the object, using a computer vision model, to identify whether one or more defects are present with the object;
- applying, by the test device, an artificial intelligence model of object failure to the at least one imaging measurement and the at least one non-imaging measurement to determine whether a failure threshold is satisfied for the object based on determining whether the one or more defects are present with the object;
- and
- providing, by the test device and based on whether the failure threshold is satisfied for the object:
- first output,
- the first output indicating that the failure threshold is not satisfied for the object, and
- the first output including a classification of at least one defect present with the object determined based at least in part on a defect classification model;
- or
- second output,
- the second output identifying a classification of a failure of the object based on the failure threshold being satisfied for the object.
9 more elements
A non-transitory computer-readable medium storing a set of instructions, the set of instructions comprising:
- one or more instructions that, when executed by one or more processors of a test device comprising a set of sensors, an enclosure, the set of sensors disposed within the enclosure, and a set of openings in the enclosure aligned to the set of sensors, cause the test device to:
- initiate, by the set of sensors, a set of measurements including at least one imaging measurement and at least one non-imaging measurement of an object using the set of sensors;
- obtain the set of measurements of the object from the set of sensors based on initiating the set of measurements;
- analyze the set of measurements of the object, using a computer vision model, to identify whether one or more defects are present with the object;
- apply an artificial intelligence model of object failure to the at least one imaging measurement and the at least one non-imaging measurement to determine whether a failure threshold is satisfied for the object based on determining whether the one or more defects are present with the object;
- and
- provide, based on whether the failure threshold is satisfied for the object:
- first output,
- the first output indicating that the failure threshold is not satisfied for the object, and
- the first output including a classification of at least one defect present with the object determined based at least in part on a defect classification model;
- or
- second output,
- the second output identifying a classification of a failure of the object based on the failure threshold being satisfied for the object.
10 more elements
Dependencies are inferred from the claim text.