G05B 2219/31459
Library with metrology plan for different type of workpieces
G05B2219/31459 (Library with metrology plan for different type of workpieces) appears on 16 US grants and 14 published applications in this corpus.
Search patents in G05B- Granted patents
- 16
- Published applications
- 14
- Assignees
- 7
- Inventors
- 48
- Latest grant
- 23 Jan 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2003 | 1 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 1 |
| 2007 | 1 | 1 |
| 2008 | 0 | 1 |
| 2009 | 2 | 1 |
| 2010 | 1 | 1 |
| 2011 | 1 | 2 |
| 2012 | 1 | 1 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 3 | 1 |
| 2016 | 0 | 0 |
| 2017 | 0 | 1 |
| 2018 | 1 | 1 |
| 2019 | 2 | 1 |
| 2020 | 1 | 1 |
| 2021 | 0 | 1 |
| 2022 | 1 | 0 |
| 2023 | 0 | 0 |
| 2024 | 1 | 0 |
By publication year.
Recent patents
- Method and platform for deployment of an industrial application on an edge computing device of a machine tool23 Jan 2024US 11,880,190 B2Siemens Aktiengesellschaft
- Manufacturing process control based on multimodality and multi-resolution time series data11 Jan 2022US 11,221,592 B2International Business Machines Corporation
- Manufacturing process control based on multi-modality and multi-resolution time series data21 Apr 2020US 10,627,787 B2International Business Machines Corporation
- Methods and apparatuses for utilizing adaptive predictive algorithms and determining when to use the adaptive predictive algorithms for virtual metrology10 Sep 2019US 10,409,231 B2APPLIED Materials.Inc.
- On-board metrology (OBM) design and implication in process tool20 Aug 2019US 10,388,549 B2APPLIED Materials.Inc.
- Method and platform for deployment of an industrial application on an edge computing device of a machine tool5 Aug 2021US 2021/0240170 A1Siemens Aktiengesellschaft
- Manufacturing process control based on multi-modality and multi-resolution time series data30 Jan 2020US 2020/0033819 A1International Business Machines Corporation
- Manufacturing process control based on multi-modality and multi-resolution time series data2 May 2019US 2019/0129365 A1International Business Machines Corporation
- Methods and apparatuses for utilizing adaptive predictive algorithms and determining when to use the adaptive predictive algorithms for virtual metrology2 Aug 2018US 2018/0217566 A1APPLIED Materials.Inc.
- On-board metrology (obm) design and implication in process tool25 May 2017US 2017/0148654 A1APPLIED Materials.Inc.
Most cited
By later US patents
- Method and apparatus for determining a sampling plan based on process and equipment fingerprinting27US 6,650,955 B1Advanced Micro Devices, Inc. · 2003
- On-board metrology (OBM) design and implication in process tool11US 10,388,549 B2APPLIED Materials.Inc. · 2019
- Manufacturing execution system with virtual-metrology capabilities and manufacturing system including the same7US 8,983,644 B2National Cheng Kung University · 2015
- Automated dynamic metrology sampling system and method for process control6US 7,487,054 B2International Business Machines Corporation · 2009
- Metrology tool recipe validator using best known methods3US 7,305,320 B2International Business Machines Corporation · 2007