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AssigneeInternational Business Machines Corporation
InventorsEjaj Ahmed, Charles N. Archie, Stephen W. Goodrich, Eric P. Solecky, Georgios A. Vakas, Erwin E. Weissmann, Lin Zhou
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A method of preparing recipes for operating a metrology tool, each recipe including a set of instructions for measuring dimensions in a microelectronic feature. A database includes a plurality of known instructions with best known methods for measuring different feature dimensions by creating a summary of a recipes used by the tool, and adding categorization attributes to identify the summary for retrieval from the database. There is provided a desired recipe having instructions for measuring desired dimensions, including a summary of parameters relating to tool function for the feature dimension to be measured. The method includes comparing the instructions in the desired recipe with the instructions in the database, identifying differences therebetween, modifying the desired recipe instructions to conform to the database instructions, verifying the desired recipe prior to using the modified desired recipe by the tool, and using the desired recipe to execute a feature measurement on the tool.
A method of preparing recipes for operating a metrology tool used to measure desired dimensions in microelectronic features, each recipe comprising a set of instructions for measuring at least one dimension in a microelectronic feature, comprising:
A method of preparing recipes for operating a metrology tool used to measure desired dimensions in microelectronic features, each recipe comprising a set of instructions for measuring at least one dimension in a microelectronic feature, comprising:
A method of preparing recipes for operating a metrology tool used to measure desired dimensions in microelectronic features, each recipe comprising a set of instructions for measuring at least one dimension in a microelectronic feature, comprising:
Dependencies are inferred from the claim text.