G01R 31/129
Of components or parts made of semiconducting materials
Official title: {of components or parts made of semiconducting materials; of LV components or parts (G01R31/18 takes precedence)}
G01R31/129 (Of components or parts made of semiconducting materials) appears on 113 US grants and 97 published applications in this corpus.
Search patents in G01R- Granted patents
- 113
- Published applications
- 97
- Assignees
- 80
- Inventors
- 257
- Latest grant
- 12 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 2 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 2 | 0 |
| 1995 | 2 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 3 | 0 |
| 2001 | 4 | 1 |
| 2002 | 2 | 4 |
| 2003 | 5 | 5 |
| 2004 | 3 | 3 |
| 2005 | 4 | 6 |
| 2006 | 7 | 1 |
| 2007 | 3 | 2 |
| 2008 | 2 | 2 |
| 2009 | 3 | 2 |
| 2010 | 1 | 2 |
| 2011 | 4 | 3 |
| 2012 | 0 | 6 |
| 2013 | 2 | 4 |
| 2014 | 6 | 7 |
| 2015 | 1 | 5 |
| 2016 | 6 | 5 |
| 2017 | 7 | 4 |
| 2018 | 4 | 4 |
| 2019 | 9 | 7 |
| 2020 | 5 | 2 |
| 2021 | 5 | 7 |
| 2022 | 2 | 4 |
| 2023 | 0 | 4 |
| 2024 | 5 | 1 |
| 2025 | 3 | 4 |
| 2026 | 2 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Electromagnetic wave detector and electromagnetic wave detector array12 May 2026US 12,624,988 B2Mitsubishi Electric Corporation
- Power device threshold voltage measurement circuit and operation method thereof13 Jan 2026US 12,523,694 B2National Yang Ming.Chiao Tung University
- Apparatus and method estimating breakdown voltage of silicon dioxide film using neural network model18 Nov 2025US 12,474,390 B2Samsung Electronics Co., Ltd.
- Photovoltaic system, power supply system, and insulation fault detection method26 Aug 2025US 12,401,320 B2Huawei Digital Power Technologies Co., Ltd.
- Semiconductor device, and method for manufacturing semiconductor device15 Apr 2025US 12,278,262 B2Rohm Co., Ltd.
- Arcing detection method and system28 May 2026US 2026/0149258 A1Gigadevice Semiconductor Inc.
- Jig for measuring breakdown voltage of insulator and method for measuring the same2 Apr 2026US 2026/0092963 A1Samsung SDI.Co., Ltd.
- Method for detecting arcing, inverter and photovoltaic system26 Jun 2025US 2025/0210960 A1Sungrow Power Supply Co., Ltd.
- Semiconductor device, and method for manufacturing semiconductor device19 Jun 2025US 2025/0203962 A1Rohm Co., Ltd.
- Power device threshold voltage measurement circuit and operation method thereof20 Feb 2025US 2025/0060403 A1National Yang Ming.Chiao Tung University
Most cited
By later US patents
- Test structures for on-chip real-time reliability testing94US 6,724,214 B2Chartered Semiconductor Manufacturing Ltd. · 2004
- Probe-oxide-semiconductor method and apparatus for measuring oxide charge on a semiconductor wafer71US 5,767,691 AInternational Business Machines Corporation · 1998
- Insulation state measurement method, insulation state judgement apparatus, and dispersion type power generating system using the same37US 5,712,572 ACanon Kabushiki Kaisha · 1998
- Dielectric breakdown prediction and dielectric breakdown life-time prediction using iterative voltage step stressing26US 5,420,513 AMitsubishi Denki Kabushiki Kaisha · 1995
- Dielecrtric breakdown prediction apparatus and method, and dielectric breakdown life-time prediction apparatus and method22US 5,594,349 AMitsubishi Denki Kabushiki Kaisha · 1997