G01R 27/2658
Cavities, resonators, free space arrangements, reflexion or interference arrangements
Official title: {Cavities, resonators, free space arrangements, reflexion or interference arrangements (G01R27/2647 takes precedence; optical methods G01R27/2682)}
G01R27/2658 (Cavities, resonators, free space arrangements, reflexion or interference arrangements) appears on 71 US grants and 49 published applications in this corpus.
Search patents in G01R- Granted patents
- 71
- Published applications
- 49
- Assignees
- 71
- Inventors
- 171
- Latest grant
- 23 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 2 | 0 |
| 1988 | 1 | 0 |
| 1989 | 2 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 2 | 0 |
| 1993 | 0 | 0 |
| 1994 | 3 | 0 |
| 1995 | 2 | 0 |
| 1996 | 5 | 0 |
| 1997 | 3 | 0 |
| 1998 | 3 | 0 |
| 1999 | 2 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 1 |
| 2002 | 0 | 0 |
| 2003 | 1 | 1 |
| 2004 | 2 | 3 |
| 2005 | 2 | 2 |
| 2006 | 2 | 2 |
| 2007 | 1 | 0 |
| 2008 | 2 | 0 |
| 2009 | 2 | 2 |
| 2010 | 1 | 1 |
| 2011 | 1 | 1 |
| 2012 | 0 | 1 |
| 2013 | 2 | 1 |
| 2014 | 0 | 2 |
| 2015 | 2 | 0 |
| 2016 | 1 | 1 |
| 2017 | 2 | 1 |
| 2018 | 2 | 3 |
| 2019 | 0 | 1 |
| 2020 | 2 | 3 |
| 2021 | 3 | 4 |
| 2022 | 1 | 4 |
| 2023 | 5 | 3 |
| 2024 | 3 | 3 |
| 2025 | 2 | 8 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Transverse magnetic mode split post dielectric resonator23 Jun 2026US 12,665,278 B2The Curators of the University of Missouri
- Complex dielectric constant sensing system and method3 Feb 2026US 12,540,962 B2Taibah University
- Measurement device and measurement method for measuring permeability and permittivity18 Nov 2025US 12,474,299 B2Tohoku University
- Dielectric characteristic measurement method and dielectric characteristic measurement system using open resonator30 Sep 2025US 12,429,509 B2EM labs, Inc.
- Substrate and material characterisation method and device11 Jun 2024US 12,007,424 B2Sony Semiconductor Solutions Corporation
- Device for measuring electrical properties using waveguide tip adapter14 May 2026US 2026/0133232 A1Korea Testing Laboratory (Ktl)
- Resonator, dielectric characteristic measurement system, and dielectric characteristic measuring method25 Sep 2025US 2025/0300340 A1Murata Manufacturing Co., Ltd.
- Current and voltage sensing based voltage-standing-wave-ratio impedance and power detector and method5 Jun 2025US 2025/0180636 A1Georgia Tech Research Corporation
- Measurement apparatus for and measurement method of measuring moisture of mineral material1 May 2025US 2025/0137941 A1Senfit Oy
- Complex dielectric constant sensing system and method27 Mar 2025US 2025/0102551 A1Taibah University
Most cited
By later US patents
- Capacitance probe for thin dielectric film characterization104US 7,001,785 B1Veeco Instruments Inc. · 2006
- Method of and device for measuring elastic and di-electric properties of the diaphragm of living cells87US 4,055,799 AKernforschungsanlage Julich Gesellschaft mit beschrankter Haftung · 1977
- Quantitative imaging of dielectric permittivity and tunability82US 6,809,533 B1University of Maryland, College Park · 2004
- Apparatus and method for sensing a liquid with a single wire transmission line76US 3,995,212 ASperry Rand Corporation · 1976
- Microwave reflection resonator sensors76US 5,334,941 AKDC Technology Corp. · 1994