Device for measuring electrical properties using waveguide tip adapter
AssigneeKorea Testing Laboratory (Ktl)
InventorsTae Seuong SONG, Sang Wook YOON, Han Hee LEE, Hong Je JANG
Life of this patent
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AssigneeKorea Testing Laboratory (Ktl)
InventorsTae Seuong SONG, Sang Wook YOON, Han Hee LEE, Hong Je JANG
Estimating the term…
Proposed is a measurement device. Provided with a waveguide having a first contact surface coming into face-to-face contact with a subject to be measured, the measurement device includes a detachable part provided at the waveguide, the detachable part coming into close contact with the first contact surface, and an extended part extending from the detachable part, wherein the extended part is provided with an extension hole communicating with an original hole provided in the waveguide. The extension hole and the original hole are provided in the same size and the same shape, the extension hole extends in a direction the same as an extension direction of the original hole, and the extension hole is aligned with the original hole.
A measurement device, comprising:
Dependencies are inferred from the claim text.