Complex dielectric constant sensing system and method
AssigneeTaibah University
InventorsMuhammad Amin, Hattan F. Abutarboush, Rashad Ramzan, Omar F. Siddiqui, Aqsa Ehsan
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AssigneeTaibah University
InventorsMuhammad Amin, Hattan F. Abutarboush, Rashad Ramzan, Omar F. Siddiqui, Aqsa Ehsan
Estimating the term…
Described herein is Complex Dielectric Constant Sensor (CDCS) incorporating microstrip based radial stub and open circuit stub pair structures that utilize interference coupling between degenerate EIT modes to detect CDC of sample-under-test (SUT). In at least one embodiment, CDCS generates two distinct EIT modes when sensor is unloaded. In at least one embodiment, coupling between resonator modes and interaction of electromagnetic fields with material is affected indicating presence of dielectric sample. In at least one embodiment, two EIT modes become degenerate, causing cancellation and suppressing transparency window when dielectric constant of SUT matches a specific value. In at least one embodiment, CDCS can detect slight changes in complex dielectric properties of SUT. In at least one embodiment, CDCS can characterize materials such as substrate samples based on their CDCs for design and characterization of microwave devices, antennas, and thin film devices.
An apparatus comprising:
A method comprising:
A system comprising:
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