G01N 2223/648
Voids
Official title: voids
G01N2223/648 (Voids) appears on 16 US grants and 17 published applications in this corpus.
Search patents in G01N- Granted patents
- 16
- Published applications
- 17
- Assignees
- 20
- Inventors
- 39
- Latest grant
- 6 Jan 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2002 | 1 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 2 |
| 2015 | 2 | 0 |
| 2016 | 0 | 1 |
| 2017 | 0 | 0 |
| 2018 | 1 | 1 |
| 2019 | 2 | 2 |
| 2020 | 0 | 3 |
| 2021 | 3 | 0 |
| 2022 | 2 | 3 |
| 2023 | 1 | 3 |
| 2024 | 0 | 0 |
| 2025 | 3 | 2 |
| 2026 | 1 | 0 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Performance evaluation method for elastic material6 Jan 2026US 12,517,021 B2Sumitomo Rubber Industries, Ltd.
- Inspection device5 Aug 2025US 12,379,334 B2Saki Corporation
- Handheld inspection device and method of inspecting an infrastructure having a structure wall supported into material25 Mar 2025US 12,259,342 B2Inversa Systems Ltd.
- Performance evaluation method for elastic material21 Jan 2025US 12,203,904 B2Sumitomo Rubber Industries, Ltd.
- Inspection position identification method, three-dimensional image generation method, and inspection device5 Dec 2023US 11,835,475 B2Saki Corporation
- Void Inspection Method, Storage and Void Inspection System25 Dec 2025US 2025/0389676 A1Shimadzu Corporation
- X-ray inspection device5 Jun 2025US 2025/0180773 A1Ishida Co., Ltd.
- Performance evaluation method for elastic material19 Oct 2023US 2023/0332990 A1Sumitomo Rubber Industries, Ltd.
- Handheld inspection device and method of inspecting an infrastructure having a structure wall supported into material15 Jun 2023US 2023/0184700 A1Inversa Systems Ltd.
- Inspection device25 May 2023US 2023/0160841 A1Saki Corporation
Most cited
By later US patents
- Detection of voids in semiconductor wafer processing18US 6,351,516 B1Jordan Valley Applied Radiation Ltd. · 2002
- X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus5US 9,222,900 B2Danmarks Tekniske Universitet of Anker Engelundsvej · 2015
- Method and system using x-ray pinhole camera for in-situ monitoring of electron beam manufacturing process2US 10,502,701 B2General Electric Company · 2019
- Inspection position identification method, three-dimensional image generation method, and inspection device1US 11,422,099 B2Saki Corporation · 2022
- Method and system for determining the location in 3D space of an object within an enclosed opaque container1US 11,486,836 B1The United States of America as represented by the Secretary of the Navy · 2022